Syskin V S

Publications in Math-Net.Ru

1. The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials
   
   Kvantovaya Elektronika, 23:8 (1996),  762–764
2. Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods
   
   Kvantovaya Elektronika, 22:2 (1995),  196–200