Kyutt Reginald Nikolaevich

Publications in Math-Net.Ru

1. Structural characterization of a short-period superlattice based on the CdF$_{2}$/CaF$_{2}$/Si(111) heterostructure by transmission electron microscopy and X-ray diffractometry
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021),  3–6
2. Intensity distribution of the three-wave diffraction from dislocation epitaxial layers in the reciprocal space
   
   Fizika Tverdogo Tela, 60:4 (2018),  691–695
3. Defect structure of GaAs layers implanted with nitrogen ions
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:18 (2018),  24–30
4. Reciprocal-space maps of X-ray diffraction intensity distribution and their relation to the dislocation structure of epitaxial layers
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:12 (2018),  96–102
5. On magnetism of nickel clusters in nanoporous carbon
   
   Fizika Tverdogo Tela, 59:10 (2017),  2056–2062
6. On the role of secondary extinction in the measurement of the integrated intensity of X-ray diffraction peaks and in the determination of the thickness of damaged epitaxial layers
   
   Fizika Tverdogo Tela, 58:6 (2016),  1058–1064
7. X-ray diffraction determination of the degree of ordering of a solid solution in epitaxial AlGaN layers
   
   Fizika Tverdogo Tela, 56:12 (2014),  2308–2310
8. The structural state of epitaxial ZnO layers assessed by measuring the integral intensity of three- and two-beam X-ray diffraction
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:20 (2014),  22–28
9. Electrical and galvanomagnetic properties of nanoporous carbon samples impregnated with bromine
   
   Fizika Tverdogo Tela, 55:7 (2013),  1386–1391
10. Structural characterization of AlGaN/GaN superlattices by three-beam X-ray diffraction
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:1 (2012),  77–85
11. Cluster structure of nanoporous carbon produced from silicon carbide
    
    Fizika Tverdogo Tela, 53:8 (2011),  1651–1657
12. Three-wave diffraction in damaged epitaxial layers with a wurtzite structure
    
    Zhurnal Tekhnicheskoi Fiziki, 81:5 (2011),  81–88
13. Photoluminescence in silicon implanted with silicon ions at amorphizing doses
    
    Fizika i Tekhnika Poluprovodnikov, 45:9 (2011),  1182–1187
14. Effect of epilayer microstructure on shape of X-Ray diffraction peaks
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 37:7 (2011),  31–37
15. X-ray diffraction diagnostics methods as applied to highly doped semiconductor single crystals
    
    Zhurnal Tekhnicheskoi Fiziki, 80:4 (2010),  105–114
16. Microstructure and strain of ZnO molecular-beam epitaxial layers on sapphire
    
    Fizika i Tekhnika Poluprovodnikov, 44:2 (2010),  265–269
17. Studying defect structure of GaN epilayers by means of three-beam X-ray diffraction analysis
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 36:15 (2010),  14–21
18. Investigation of silicon by diffuse gamma-ray and X-ray scattering
    
    Fizika Tverdogo Tela, 34:8 (1992),  2548–2554
19. Молекулярно-пучковая эпитаксия однодоменного арсенида галлия на (001) кремнии, пассивированном водородом
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 18:2 (1992),  1–5
20. Nonergodicity and dielectric nonlinearity of lead magnoniobate crystals in the region of the diffuse phase transition
    
    Fizika Tverdogo Tela, 33:1 (1991),  35–40
21. Поляризация фотолюминесценции с поверхности гетероструктуры A$^{\text{III}}$B$^{\text{V}}$ с профилированной подложкой
    
    Fizika i Tekhnika Poluprovodnikov, 25:1 (1991),  12–16
22. Structural perfection of $\mathrm{InAs}_{1-x-y}\mathrm{Sb}_{x}\mathrm{P}_{y}$–$\mathrm{InAs}$ double heterostructures
    
    Fizika Tverdogo Tela, 32:11 (1990),  3355–3361
23. COMPOSITION STOICHIOMETRY IN GAAS FILMS GROWN BY THE GAS-PHASE EPITAXY METHOD
    
    Zhurnal Tekhnicheskoi Fiziki, 60:11 (1990),  201–203
24. Kinetics of phosphorus solid solution decomposition in diffused $\mathrm{Si}$ layers
    
    Fizika Tverdogo Tela, 31:10 (1989),  182–188
25. X-ray Bragg diffraction on epitaxial films of inhomogeneous composition
    
    Fizika Tverdogo Tela, 31:8 (1989),  270–272
26. Effect of misfit dislocations on the Bragg X-ray diffraction in heterostructures
    
    Fizika Tverdogo Tela, 31:1 (1989),  40–45
27. EFFECT OF SURFACE DISTORTIONS ON DIFFRACTION CURVES IN MOVING GEOMETRY
    
    Zhurnal Tekhnicheskoi Fiziki, 59:9 (1989),  134–139
28. Defect formation under the annealing of neutron-irradiated $\mathrm{SiC}$
    
    Fizika Tverdogo Tela, 30:9 (1988),  2606–2610
29. DETECTION OF DISLOCATION NETS IN THIN NEAR-SURFACE CRYSTAL DOMAINS BY THE SLIDING X-RAY-DIFFRACTION METHOD
    
    Zhurnal Tekhnicheskoi Fiziki, 58:3 (1988),  583–585
30. A new type of interference bands in Bragg section topograms
    
    Fizika Tverdogo Tela, 29:5 (1987),  1608–1611
31. MEASURING THE SCATTERING OF X-RAYS UNDER THE MIRROR REFLECTION IN THE DIFFERENTIAL REGIME
    
    Zhurnal Tekhnicheskoi Fiziki, 57:7 (1987),  1436–1438
32. IDENTIFICATION OF SURFACE AND VOLUME DEFECTS ON INTENSITY OF DIFFUSION SCATTERING
    
    Zhurnal Tekhnicheskoi Fiziki, 57:1 (1987),  178–180
33. Diffusion scattering on rod-like defects in oxygen-containing silicon crystals
    
    Fizika Tverdogo Tela, 27:3 (1985),  673–677
34. MEASUREMENT OF ANGULAR-DISTRIBUTIONS OF THE X-RAY DIFFUSE-SCATTERING ON THE TRIPLE CRYSTAL DIFFRACTOMETER WITH LAUE-CASE DIFFRACTIONS
    
    Zhurnal Tekhnicheskoi Fiziki, 55:2 (1985),  391–393