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Lyakin Dmitrii Vladimirovich

Publications in Math-Net.Ru

  1. A method for investigating the spatial correlation properties of a stochastic wave field

    Zhurnal Tekhnicheskoi Fiziki, 95:5 (2025),  989–996
  2. Local angular spectrum of the disturbance of a monochromatic wave field

    Optics and Spectroscopy, 132:12 (2024),  1268–1279
  3. Signal of an autocorrelation low-coherence interferometer probing a layered object by a wave-field with wide angular spectrum

    Computer Optics, 45:3 (2021),  340–349
  4. Erratum to: “The influence of the numerical aperture of a beam probing an object on the determination of the thickness of a layered object in confocal microscopy” [Optics and spectroscopy, 123(3), 487 (2017)]

    Optics and Spectroscopy, 127:3 (2019),  528
  5. Aberration-free width of angular spectrum of a field probing a layered object in confocal microscopy

    Optics and Spectroscopy, 127:3 (2019),  514–522
  6. Instantaneous speckle structures in a partially coherent optical wave field with broad frequency and angular spectra

    Optics and Spectroscopy, 126:2 (2019),  186–196
  7. Digital speckle photography of subpixel displacements of speckle structures based on analysis of their spatial spectra

    Optics and Spectroscopy, 124:4 (2018),  518–527
  8. Coherence volume of an optical wave field with broad frequency and angular spectra

    Optics and Spectroscopy, 124:3 (2018),  348–358
  9. Methods of digital holography in interference microscopy of reflective object in partially coherent light

    Izv. Sarat. Univ. Physics, 16:2 (2016),  67–80
  10. Longitudinal correlation properties of an optical field with broad angular and frequency spectra and their manifestation in interference microscopy

    Kvantovaya Elektronika, 43:10 (2013),  949–957
  11. Changes in longitudinal spatial coherence length of optical field in image space

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 37:1 (2011),  94–102
  12. Method for remote diagnostics of the internal structure of layered media

    Kvantovaya Elektronika, 38:6 (2008),  563–569


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