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Publications in Math-Net.Ru
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X-ray crystal cavity and resonators
Zhurnal Tekhnicheskoi Fiziki, 95:8 (2025), 1447–1457
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Pumping and X-ray probing technique
UFN, 195:9 (2025), 962–981
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Minimization of thermal distortions arising in optical elements under the influence of intense X-ray sources (review)
Zhurnal Tekhnicheskoi Fiziki, 94:1 (2024), 7–25
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X-ray dark field imaging
Optics and Spectroscopy, 132:4 (2024), 465–482
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X-ray refraction introscopy
UFN, 194:4 (2024), 345–359
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Talbot and Talbot–Lau X-ray interferometers
UFN, 193:10 (2023), 1047–1070
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Adaptive and active X-ray optics
Optics and Spectroscopy, 130:8 (2022), 1229–1247
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Focusing diffraction optics for orbital telescopes
Optics and Spectroscopy, 130:7 (2022), 1041–1067
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X-ray diffraction topography methods (review)
Fizika Tverdogo Tela, 63:2 (2021), 165–190
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Focusing capillar and porous X-ray optics
Optics and Spectroscopy, 129:11 (2021), 1444–1460
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Precise determination of crystal lattice parameters
UFN, 190:9 (2020), 971–994
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Multilayer X-ray interference structures
UFN, 189:11 (2019), 1137–1171
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X-ray fluorescence imaging
UFN, 188:10 (2018), 1081–1102
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X-ray microscopy
UFN, 187:2 (2017), 201–219
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X-ray holography
UFN, 185:4 (2015), 393–413
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X-ray crystal interferometers
UFN, 184:11 (2014), 1217–1236
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X-ray diffraction study of distorted surface layers of $\mathrm{Si} (111)$ and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model
Fizika Tverdogo Tela, 31:4 (1989), 74–81
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Crystalline structure of $\mathrm{Na}_2\mathrm{Cu}[\mathrm{Si}_4\mathrm{O}_{10}]$
Dokl. Akad. Nauk SSSR, 205:4 (1972), 831–833
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