Polkovnikov Vladimir Nikolaevich

Publications in Math-Net.Ru

1. Double-mirror monochromator for the 4+ generation “SKIF” synchrotron light source
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1963–1972
2. Kirkpatrick–Baez focusing system for synchrotron applications
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1954–1962
3. Reconstruction of optical constants of thin films from laboratory reflectometers
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1946–1953
4. Structural and reflective characteristics of Cr/C multilayer mirrors synthesized by reactive sputtering method
   
   Zhurnal Tekhnicheskoi Fiziki, 95:9 (2025),  1817–1824
5. Multilayer NiMo/C structures fabricated by reactive magnetron sputtering
   
   Zhurnal Tekhnicheskoi Fiziki, 95:9 (2025),  1808–1816
6. Study of structural and reflective characteristics of multilayer X-ray mirrors based on a pair of Ru/B materials
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 51:1 (2025),  57–60
7. Correlative extreme ultraviolet, ultraviolet and optical microscopy based on a specular microscope with axial tomography
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1302–1313
8. High-gradient aspherization of substrates with thin-film Al/Si coatings
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1288–1294
9. Ni-based multilayer structures for Goebel-type mirrors
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1280–1287
10. Study of the structural and reflective characteristics of short-period Mo/Be multilayer X-ray mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1269–1279
11. Boron based X-ray multilayer mirrors for the spectral range 6.7–9 nm
    
    Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1260–1268
12. Multilayer mirrors based on Cr/Ti for X-Ray microscopy in the “water window”
    
    Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1250–1259
13. Short-period multilayer mirrors for high-resolution multilayer mirror/crystal monochromator
    
    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  943–947
14. Investigation of the properties of multilayer mirrors based on a pair of materials Mo/B$_4$C
    
    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  931–935
15. Project of a two-mirror monochromator for the photon energy range 8–36 keV for the “SKIF” synchrotron
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1261–1266
16. Prospective wavelengths for projection lithography uing synchrotron radiation
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1207–1212
17. Ru/Sr multilayer mirrors for the spectral range 9–12 nm
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1179–1184
18. Research and creation of broadband X-ray mirrors with a spectral transmission band coinciding with emission lines and the possibility of filtering
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1107–1112
19. Manufacturing and research of mirrors with a wide bandwidth for synchrotron applications
    
    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1524–1531
20. Measurements of the absolute values of the radiation intensity in the wavelength range of 6.6–32 nm of stainless steel targets with pulsed laser excitation
    
    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1448–1453
21. Solar VUV telescope for nanosatellites
    
    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1441–1447
22. Measurements of the absolute intensities of spectral lines of Kr, Ar, and O ions in the wavelength range of 10--18 nm under pulsed laser excitation
    
    Kvantovaya Elektronika, 51:8 (2021),  700–707
23. Multilayer Cr/Sc mirrors with improved reflection for the “water transparency window” range
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1893–1897
24. The microstructure of transition boundaries in multilayer Mo/Be systems
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1884–1892
25. Broadband mirrors for spectroheliographs at the KORTES sun study facility
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1876–1883
26. The smoothing effect of si layers in multilayer Be/Al mirrors for the 17- to 31-nm range
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1870–1875
27. Modification and polishing of the holographic diffraction grating grooves by a neutralized Ar ion beam
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1864–1869
28. Application of novel multilayer normal-incidence mirrors for euv solar spectroscopy
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1817–1820
29. Lasing efficiency of krypton ions in the (8–14)-nm band upon pulsed laser excitation
    
    Kvantovaya Elektronika, 50:4 (2020),  408–413
30. Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources
    
    Kvantovaya Elektronika, 50:4 (2020),  401–407
31. Diffraction limited X-ray optics: technology, metrology, applications
    
    UFN, 190:1 (2020),  74–91
32. Influence of thermal annealing on the properties of multilayer Mo/Be mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1783–1788
33. Influence of beryllium barrier layers on the properties of Mo/Si multilayer mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1779–1782
34. Multilayer Ag/Y mirrors for the spectral range of 9–11 nm
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1774–1778
35. Optimization of composition, synthesis, and study of broadband multilayer mirrors for the EUV spectral range
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1763–1769
36. Beryllium as a material for thermally stable X-ray mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1686–1691
37. Stable multilayer reflective coatings for $\lambda$(HeI) = 58.4 nm for the kortes solar telescope
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:3 (2019),  26–29
38. Comparison of approaches in the manufacture of broadband mirrors for the EUV range: aperiodic and stack structures
    
    Kvantovaya Elektronika, 49:4 (2019),  380–385
39. Absolutely calibrated spectrally resolved measurements of Xe laser plasma radiation intensity in the EUV range
    
    Zhurnal Tekhnicheskoi Fiziki, 88:10 (2018),  1554–1558
40. Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5 – 50 nm: description and testing results
    
    Kvantovaya Elektronika, 47:4 (2017),  385–392
41. Effect of structural defects of aperiodic multilayer mirrors on the properties of reflected (sub)femtosecond pulses
    
    Kvantovaya Elektronika, 47:4 (2017),  378–384
42. The diffraction efficiency of echelle gratings increased by ion-beam polishing of groove surfaces
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:16 (2016),  34–40
43. Effect of roughness, deterministic and random errors in film thickness on the reflecting properties of aperiodic mirrors for the EUV range
    
    Kvantovaya Elektronika, 46:5 (2016),  406–413
44. X-ray optical system for imaging laser plumes with a spatial resolution of up to 70 nm
    
    Kvantovaya Elektronika, 46:4 (2016),  347–352
45. A new alternative to secondary CsM$^+$ ions for depth profiling of multilayer metal structures by secondary ion mass spectrometry
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:24 (2012),  75–85
46. Silicon photodiode with selective Zr/Si coating for extreme ultraviolet spectral range
    
    Kvantovaya Elektronika, 42:10 (2012),  943–948
47. Multilayer X-ray mirrors based on La/B$_4$C and La/B$_9$C
    
    Zhurnal Tekhnicheskoi Fiziki, 80:8 (2010),  93–100


48. Beryllium-based multilayer X-ray optics
    
    UFN, 190:1 (2020),  92–106