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Publications in Math-Net.Ru
Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer
PFMT
, 2015, no. 3(24),
33–37
Ellipsometry of the transitive layers semiconductor–dielectric
PFMT
, 2013, no. 2(15),
18–24
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Steklov Math. Inst. of RAS
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