Sotski A B

Publications in Math-Net.Ru

1. Maximizing the sensitivity of thin film metal-dielectric refractometers
   
   Optics and Spectroscopy, 133:8 (2025),  896–906
2. Optical characteristics of boron-doped silicon wafers after rapid thermal annealing
   
   Optics and Spectroscopy, 133:8 (2025),  874–880
3. $m$-Line method for reflectometry of ultrathin layers
   
   Zhurnal Tekhnicheskoi Fiziki, 94:2 (2024),  267–277
4. Fourier analysis of modes of microstructured optical fibers
   
   Zhurnal Tekhnicheskoi Fiziki, 92:12 (2022),  1898–1908
5. Sensitivity of reflecting terahertz sensors of aqueous solutions
   
   Zhurnal Tekhnicheskoi Fiziki, 91:2 (2021),  315–325
6. Ellipsometry of metallic films under the conditions of the anomalous skin effect
   
   Optics and Spectroscopy, 129:7 (2021),  889–898
7. Optical characteristics of a europium-doped barium titanate inhomogeneous layer
   
   Optics and Spectroscopy, 129:4 (2021),  506–511
8. To attainment of pronounced structural coloring of a photonic crystal fiber
   
   PFMT, 2021, no. 4(49),  51–56
9. Spectrophotometry of layers on plane parallel substrates
   
   Optics and Spectroscopy, 128:8 (2020),  1133–1143
10. Calculation of the waveguide probe for terahertz spectroscopy of a layered medium
    
    PFMT, 2020, no. 1(42),  55–60
11. Optical characteristics of strontium titanate films obtained by the sol–gel method
    
    Optics and Spectroscopy, 125:4 (2018),  473–478
12. Propagation of terahertz pulses in capillary waveguides with a metalized cladding
    
    Computer Optics, 41:6 (2017),  803–811
13. Waveguide spectroscopy of bilayer structures
    
    Zhurnal Tekhnicheskoi Fiziki, 85:8 (2015),  116–123
14. Multiple reflections of light in the prism coupler
    
    PFMT, 2015, no. 2(23),  18–28
15. Reflection of the TE polarized light from a metallic film at the anomalous skin effect
    
    PFMT, 2015, no. 1(22),  21–26
16. Diffraction of light beam on microstructured fiber
    
    Computer Optics, 38:1 (2014),  11–19
17. Prism excitation of leaky modes of thin films
    
    Zhurnal Tekhnicheskoi Fiziki, 83:11 (2013),  105–115
18. Electrodynamic model of the bending fiber-optic sensor
    
    PFMT, 2013, no. 1(14),  43–47
19. The account of influence of the natural surface layer under investigation of silicon plates by the method of spectral ellipsometry
    
    PFMT, 2012, no. 1(10),  26–30
20. Circular fourier analysis of modes of microstructured optical fibers with complex channel cross sections
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 36:10 (2010),  81–90