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Publications in Math-Net.Ru
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Optical characteristics of boron-doped silicon wafers after rapid thermal annealing
Optics and Spectroscopy, 133:8 (2025), 874–880
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Optical characteristics of a europium-doped barium titanate inhomogeneous layer
Optics and Spectroscopy, 129:4 (2021), 506–511
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Spectrophotometry of layers on plane parallel substrates
Optics and Spectroscopy, 128:8 (2020), 1133–1143
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Optical characteristics of strontium titanate films obtained by the sol–gel method
Optics and Spectroscopy, 125:4 (2018), 473–478
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The analytical solution of the inverse problem for the spectrophotometric transparent layer on an absorbing substrate
PFMT, 2015, no. 4(25), 31–37
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Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer
PFMT, 2015, no. 3(24), 33–37
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Ellipsometry of the transitive layers semiconductor–dielectric
PFMT, 2013, no. 2(15), 18–24
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The account of influence of the natural surface layer under investigation of silicon plates by the method
of spectral ellipsometry
PFMT, 2012, no. 1(10), 26–30
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