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Publications in Math-Net.Ru
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Радиационная стойкость датчиков МНПВО на основе двойных гетероструктур $p$-InAsSbP/$n$-InAs, облученных гамма-квантами
Zhurnal Tekhnicheskoi Fiziki, 96:1 (2026), 112–121
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Reduction of external quantum efficiency of ultraviolet LEDs caused by overdoping of barriers with silicon
Fizika i Tekhnika Poluprovodnikov, 59:7 (2025), 397–401
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Graphene-based biosensors for neurodegenerative dementia detection
Pisma v Zhurnal Tekhnicheskoi Fiziki, 51:3 (2025), 13–16
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Solar-blind Schottky photodiodes based on AlGaN:Si/AlN, grown by plasma-activated molecular beam epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 50:20 (2024), 16–19
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Optical characterization of InGaAsP/InP(001) heterostructures
Pisma v Zhurnal Tekhnicheskoi Fiziki, 50:15 (2024), 47–50
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Study of stress relief and strain distribution in graphene films of biosensors for viral infections
Fizika Tverdogo Tela, 65:12 (2023), 2216–2219
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Participation of defects localized at heterointerfaces and extended defects in the degradation of nitride-based light-emitting devices
Optics and Spectroscopy, 131:11 (2023), 1499–1501
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Modification in adsorption properties of graphene during the development of viral biosensors
Fizika i Tekhnika Poluprovodnikov, 56:12 (2022), 1137–1143
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Temperature-dependent decrease in efficiency in power blue InGaN/GaN LEDs
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:24 (2020), 45–48
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Effect of electron irradiation with an energy of 0.9 MeV on the I–V characteristics and low-frequency noise in 4$H$-SiC pin diodes
Fizika i Tekhnika Poluprovodnikov, 53:4 (2019), 555–561
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Diversity of properties of device structures based on group-III nitrides, related to modification of the fractal-percolation system
Fizika i Tekhnika Poluprovodnikov, 52:7 (2018), 804–811
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The effect of dose of nitrogen-ion implantation on the concentration of point defects introduced into GaAs layers
Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:13 (2018), 44–50
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Stress relaxation in InGaAsP/InP heterostructures for 1064-nm laser radiation converters
Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:2 (2017), 3–9
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On the fractal nature of light-emitting structures based on III–N nanomaterials and related phenomena
Fizika i Tekhnika Poluprovodnikov, 50:9 (2016), 1195–1201
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Specific features of proton interaction with transistor structures having a 2D AlGaN/GaN channel
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:21 (2016), 39–46
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The relationship between the reliability of transistors with 2D AlGaN/GaN channel and organization type of nanomaterial
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:13 (2016), 80–86
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Solar-blind Al$_{x}$Ga$_{1-x}$N ($x>$ 0.45) $p$–$i$–$n$ photodiodes with a polarization-$p$-doped emitter
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:12 (2016), 57–63
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Study of the degradation of the external quantum efficiency of UV LEDs based on AlGaN/GaN heterostructures grown by chloride-hydride vapor-phase epitaxy
Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:13 (2014), 73–80
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Low-frequency noise in as-fabricated and degraded blue InGaAs/GaN LEDs
Fizika i Tekhnika Poluprovodnikov, 46:2 (2012), 219–223
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Effect of the silicon doping level and features of nanostructural arrangement on decrease in external quantum efficiency in InGaN/GaN light-emitting diodes with increasing current
Fizika i Tekhnika Poluprovodnikov, 45:3 (2011), 425–431
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Frequency and temperature dependences of capacitance-voltage characteristics of InGaN/GaN light-emitting structures with multiple quantum wells
Fizika i Tekhnika Poluprovodnikov, 45:2 (2011), 226–229
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Structural and electrical properties of SiGe-on-insulator substrates fabricated by direct bonding
Fizika i Tekhnika Poluprovodnikov, 44:8 (2010), 1135–1139
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Oscillations in the threshold photoemission spectra of GaN(0001) with submonolayer Cs coverages
Pis'ma v Zh. Èksper. Teoret. Fiz., 77:5 (2003), 270–274
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Heterostructures based on nitrides of group III elements: technical processes, properties, and light-emitting devices
UFN, 171:8 (2001), 857–858
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ZN DIFFUSION IN INP AND ZN-BASED SOLID-SOLUTIONS FROM POLYMER FILM
DIFFUSANTS
Pisma v Zhurnal Tekhnicheskoi Fiziki, 18:13 (1992), 35–38
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Исследование влияния химической обработки InP на скорость
поверхностной рекомбинации методом комбинационного
рассеяния света
Fizika i Tekhnika Poluprovodnikov, 24:12 (1990), 2177–2180
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Исследование кинетики фотопроводимости в коротких фоторезисторах на
основе InP : Fe
Fizika i Tekhnika Poluprovodnikov, 24:12 (1990), 2167–2171
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Измерение ВАХ InGaAs при помощи пикосекундной электрооптической
стробирующей установки
Fizika i Tekhnika Poluprovodnikov, 24:5 (1990), 848–854
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SCHOTTKY BARRIERS AND INGAAS/INP-BASED FIELD TRANSISTORS
Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:19 (1988), 1807–1810
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Study of Minority-Carrier Lifetime in the Narrow-Band Region of Diode InGaAsP/InP Structures
Fizika i Tekhnika Poluprovodnikov, 21:8 (1987), 1498–1501
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Removal of a Nonequilibrium Plasma from Short InP : Fe Photoresistors by an Electric Field
Fizika i Tekhnika Poluprovodnikov, 21:1 (1987), 70–74
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Determination of AFC of fast-response photodetectors using the homodyne glass-fiber diagram of optical signal amplitude pulses
Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:17 (1987), 1059–1062
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FORMATION OF HETEROGENEOUS COMPENSATION DOMAIN IN THE PROCESS OF
OBTAINING PLANAR SILICON P-N-JUNCTIONS
Zhurnal Tekhnicheskoi Fiziki, 55:10 (1985), 2064–2066
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INVESTIGATION OF PIN-PHOTODIODES BASED ON INGAASP/INP
Zhurnal Tekhnicheskoi Fiziki, 55:8 (1985), 1566–1569
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Study of Leakage Currents of Planar $p{-}n$ Junctions in InP and of $p{-}i{-}n$ Structures Based on InGaAs/InP
Fizika i Tekhnika Poluprovodnikov, 19:4 (1985), 668–673
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PHOTO-TRANSISTOR BASED ON N-P-N HETEROSTRUCTURES IN THE INP-INGAASP
SYSTEM
Pisma v Zhurnal Tekhnicheskoi Fiziki, 10:21 (1984), 1294–1297
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Высокоэффективный фотодетектор
для ультрафиолетового излучения
Pisma v Zhurnal Tekhnicheskoi Fiziki, 9:24 (1983), 1516–1519
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