Toropov Mikhail Nikolaevich

Publications in Math-Net.Ru

1. Correlative extreme ultraviolet, ultraviolet and optical microscopy based on a specular microscope with axial tomography
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1302–1313
2. Off-axis aspherical collector for EUV-lithography and SXR microscopy
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  963–967
3. Method for obtaining atomically smooth substrates from single-crystal silicon by mechanical lapping
   
   Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1267–1272
4. Project of a two-mirror monochromator for the photon energy range 8–36 keV for the “SKIF” synchrotron
   
   Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1261–1266
5. Diamond-carbide-silicon composite “skeleton” as a promising material for X-ray optical substrates
   
   Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1238–1242
6. Imaging system of a plasma torch of a Betatron X-ray source
   
   Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1202–1206
7. Application of cerium oxide nanopowders for silicon polishing
   
   Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1588–1596
8. Wavefront lens corrector for studying flat surfaces
   
   Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1583–1587
9. Solar VUV telescope for nanosatellites
   
   Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1441–1447
10. Obtaining of smooth high-precision surfaces by the mechanical lapping method
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1958–1964
11. Lasing efficiency of krypton ions in the (8–14)-nm band upon pulsed laser excitation
    
    Kvantovaya Elektronika, 50:4 (2020),  408–413
12. Diffraction limited X-ray optics: technology, metrology, applications
    
    UFN, 190:1 (2020),  74–91
13. Measurement error of interferometers with diffraction reference wave
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1789–1794
14. Fabrication and study of a concave crystal mirror for the KORTES project
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1770–1773
15. X-ray optical system for imaging laser plumes with a spatial resolution of up to 70 nm
    
    Kvantovaya Elektronika, 46:4 (2016),  347–352
16. Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands
    
    UFN, 182:7 (2012),  727–747