|
|
Publications in Math-Net.Ru
-
New approaches to three-dimensional dislocation reconstruction in silicon from X-ray topo-tomography data
UFN, 193:9 (2023), 1001–1009
-
Section methods of X-ray diffraction topography
Zhurnal Tekhnicheskoi Fiziki, 92:10 (2022), 1475–1496
-
Unusual X-shaped defects in the silicon single crystal subjected to four-point bending
Pis'ma v Zh. Èksper. Teoret. Fiz., 113:3 (2021), 161–167
-
Oxygen vacancies and valence states of iron in SrFeO$_{3-\delta}$ compounds
Fizika Tverdogo Tela, 62:10 (2020), 1698–1705
-
Formation of edge dislocation image under anomalous X-ray transmission
Fizika Tverdogo Tela, 61:8 (2019), 1499–1504
-
A new high-sensitivity X-ray diffraction technique for determining local deformations of a crystal surface using “bending interference fringes”
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:18 (2016), 55–62
-
X-ray diffraction imaging of defects in topography (microscopy) studies
UFN, 185:9 (2015), 897–915
-
A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography
Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:21 (2012), 70–76
-
X-ray diffraction in a uniformly bent crystal in reflection geometry
Fizika Tverdogo Tela, 53:1 (2011), 35–40
-
Fine structure of twin boundaries in $\mathrm{GdBa}_{2}\mathrm{Cu}_{3}\mathrm{O}_{7-\delta}$
Fizika Tverdogo Tela, 31:3 (1989), 131–138
© , 2026