Trukhanov Evgenii Mikailovich

Publications in Math-Net.Ru

1. An unusual mechanism of misfit stress relaxation in thin nanofilms
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:22 (2019),  28–31
2. The reliability of revealing threading dislocations in epitaxial films by structure-sensitive etching
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:20 (2018),  30–36
3. X-ray diffraction analysis of epitaxial layers with the properties of a dislocation filter
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:13 (2018),  19–27
4. The structural state of epitaxial GaP films of different polarities grown on misoriented Si(001) substrates
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:4 (2017),  64–71
5. Density of dislocations in CdHgTe heteroepitaxial structures on GaAs(013) and Si(013) substrates
   
   Fizika Tverdogo Tela, 57:11 (2015),  2095–2101
6. Morphology and structural and electrical parameters of float-zone Si(111) single crystals
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:15 (2015),  33–39
7. Initial stages of Ge epitaxy on Si(111) under quasi-equilibrium growth conditions
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 92:6 (2010),  429–437