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Khalchev Viktor Feodosievich

Publications in Math-Net.Ru

  1. The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

    Avtomat. i Telemekh., 2007, no. 1,  163–174
  2. The exhaustive test generator based on a binary counter for a type of synchronous automaton with finite memory

    Avtomat. i Telemekh., 2000, no. 10,  164–170
  3. Decomposition of discrete devices for testable transformation

    Avtomat. i Telemekh., 1999, no. 7,  131–141
  4. Construction of an Exhausting Test for Automata with Finite Memory. II

    Avtomat. i Telemekh., 1997, no. 5,  142–152
  5. Construction of an Exhausting Test for Automata with Finite Memory. I

    Avtomat. i Telemekh., 1997, no. 4,  213–226
  6. Generation of an exhaustive test for automata with finite memory. I

    Avtomat. i Telemekh., 1991, no. 4,  147–156
  7. Using associative memory to solve systems of logical equations

    Avtomat. i Telemekh., 1990, no. 1,  109–124
  8. Use of associative memory in organizing a diagnostic modeling of logical circuits

    Avtomat. i Telemekh., 1987, no. 1,  157–170
  9. Transformation of a Structural Automaton with Memory to a Form Suitable for Supervision

    Avtomat. i Telemekh., 1975, no. 9,  189–197
  10. Detection of multiple faults in a tree logical network with memory

    Avtomat. i Telemekh., 1975, no. 8,  143–149
  11. Construction of a complete fault-detection test for series-connected single loops

    Avtomat. i Telemekh., 1975, no. 4,  111–121
  12. Multiple fault detection in single circuits

    Avtomat. i Telemekh., 1975, no. 3,  123–132

  13. On incompleteness of the methods for design of a tests sequence for a specified fault in an automaton with memory

    Avtomat. i Telemekh., 1977, no. 10,  177–178


© Steklov Math. Inst. of RAS, 2026