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Publications in Math-Net.Ru
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The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS
Avtomat. i Telemekh., 2007, no. 1, 163–174
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The exhaustive test generator based on a binary counter for a type of synchronous automaton with finite memory
Avtomat. i Telemekh., 2000, no. 10, 164–170
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Decomposition of discrete devices for testable transformation
Avtomat. i Telemekh., 1999, no. 7, 131–141
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Construction of an Exhausting Test for Automata with Finite Memory. II
Avtomat. i Telemekh., 1997, no. 5, 142–152
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Construction of an Exhausting Test for Automata with Finite Memory. I
Avtomat. i Telemekh., 1997, no. 4, 213–226
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Generation of an exhaustive test for automata with finite memory. I
Avtomat. i Telemekh., 1991, no. 4, 147–156
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Using associative memory to solve systems of logical equations
Avtomat. i Telemekh., 1990, no. 1, 109–124
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Use of associative memory in organizing a diagnostic modeling of logical circuits
Avtomat. i Telemekh., 1987, no. 1, 157–170
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Transformation of a Structural Automaton with Memory to a Form Suitable for Supervision
Avtomat. i Telemekh., 1975, no. 9, 189–197
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Detection of multiple faults in a tree logical network with memory
Avtomat. i Telemekh., 1975, no. 8, 143–149
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Construction of a complete fault-detection test for series-connected single loops
Avtomat. i Telemekh., 1975, no. 4, 111–121
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Multiple fault detection in single circuits
Avtomat. i Telemekh., 1975, no. 3, 123–132
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On incompleteness of the methods for design of a tests sequence for a specified fault in an automaton with memory
Avtomat. i Telemekh., 1977, no. 10, 177–178
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