Asadchikov Viktor Evgenievich

Publications in Math-Net.Ru

1. Structure of the hidden interfaces in liquid crystal electro-optical cell studied by X-ray scattering and atomic force microscopy
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 122:7 (2025),  416–418
2. Change of fractal geometry of microcracks during deformation: X-ray microtomography, acoustic emission and discrete element modeling
   
   Fizika Tverdogo Tela, 66:9 (2024),  1623–1630
3. Microwave synthesis method for obtaining temperature-activated carbon materials
   
   Zhurnal Tekhnicheskoi Fiziki, 94:6 (2024),  871–880
4. Second harmonic microscopy from nearsurface plasma ignited by tightly focused femtosecond fiber laser beam
   
   Optics and Spectroscopy, 132:1 (2024),  34–41
5. New approaches to three-dimensional dislocation reconstruction in silicon from X-ray topo-tomography data
   
   UFN, 193:9 (2023),  1001–1009
6. The obtaining of regular metal and dielectric microstructures based on irradiation–modified polymer films
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:6 (2022),  7–10
7. On the spectrum of interlayer roughnesses in a phospholipid multilayer
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 114:10 (2021),  674–679
8. Canted magnetic interlayer ordering in a [Fe(3.0 nm)/Cr(1.2 nm)]$_{10}$ structure revealed by synchrotron Mössbauer reflectometry with polarization analysis
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 113:3 (2021),  175–181
9. Unusual X-shaped defects in the silicon single crystal subjected to four-point bending
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 113:3 (2021),  161–167
10. Analysis of the tomographic reconstruction from polychromatic projections for objects with highly absorbing inclusions
    
    Informatsionnye Tekhnologii i Vychslitel'nye Sistemy, 2020, no. 3,  49–61
11. Contribution of lattice defects to the intensity of quasi-forbidden X-ray reflections of diamond: comparison of X-ray topography and infrared spectroscopy data
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 111:9 (2020),  597–601
12. Lateral inhomogeneities of sapphire plates determined with the aid of X-ray and probe methods
    
    Zhurnal Tekhnicheskoi Fiziki, 90:3 (2020),  419–426
13. Correcting the characteristics of silicon photodiodes by ion implantation
    
    Fizika i Tekhnika Poluprovodnikov, 54:6 (2020),  557–563
14. Microstructure of Si crystals subjected to irradiation with high-energy H$^+$ ions and heat treatment by high-resolution three-crystal X-ray diffraction and transmission electron microscopy
    
    Fizika Tverdogo Tela, 61:10 (2019),  1754–1762
15. On change in the silicon crystal structure implanted with hydrogen ions during annealing based on three-crystal X-ray diffractometry data
    
    Fizika Tverdogo Tela, 61:8 (2019),  1437–1442
16. Electrostatic and structural effects at the adsorption of polylysine on the surface of the DMPS monolayer
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 109:5 (2019),  340–346
17. X-ray diagnostics of microstructure defects of silicon crystals irradiated by hydrogen ions
    
    Zhurnal Tekhnicheskoi Fiziki, 89:5 (2019),  731–736
18. Regular microstructures based on polyethylene terephthalate films
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:5 (2019),  49–51
19. Model-independent X-ray scattering study of a silica sol surface
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 107:6 (2018),  394–399
20. Template synthesis of iron microstructures based on track membranes
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:14 (2018),  66–72
21. X-ray study of the structure of phospholipid monolayers on the water surface
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 106:8 (2017),  515–520
22. Kinetics of the formation of a phospholipid multilayer on a silica sol surface
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 104:12 (2016),  880–887
23. On the formation of a macroscopically flat phospholipid membrane on a hydrosol substrate
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 102:7 (2015),  536–541
24. Structure and properties of “nematically ordered” aerogels
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 101:8 (2015),  613–619
25. Quality diagnostics of concave spherical surfaces by a grazing X-ray beam
    
    Zhurnal Tekhnicheskoi Fiziki, 84:1 (2014),  145–149
26. A computationally efficient version of the algebraic method for computer tomography
    
    Avtomat. i Telemekh., 2013, no. 10,  86–97
27. X-ray tomographic image of a deposit on a spherical surface
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 94:9 (2011),  738–741
28. Condensation of silica nanoparticles on a phospholipid membrane
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 94:7 (2011),  625–628
29. Two-dimensional image magnification in an asymmetric-reflection X-ray microscope
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 85:1 (2007),  106–108
30. X-ray microscopy with asymmetrical reflection from a single crystal
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 73:4 (2001),  205–209
31. Determination of the roughness of concave laser mirrors
    
    Kvantovaya Elektronika, 24:9 (1997),  845–850
32. Reflective soft x-ray microscope for the investigation of objects illuminated by laser-plasma radiation
    
    Kvantovaya Elektronika, 22:9 (1995),  951–954