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Publications in Math-Net.Ru
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Localization of multiple faults with group control on a discrete device
Avtomat. i Telemekh., 2017, no. 12, 118–130
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Increasing resolvability for the matrix fault localization method
Avtomat. i Telemekh., 2016, no. 8, 159–166
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Localization of faulty multi-output unit in discrete device
Avtomat. i Telemekh., 2015, no. 2, 141–149
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The matrix test response analysis technique for FPGA
Probl. Upr., 2014, no. 5, 65–69
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A matrix method for PLD failure localization
Avtomat. i Telemekh., 2013, no. 9, 119–124
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Compaction of test response at self-testing in the programmable logic matrices
Avtomat. i Telemekh., 2013, no. 2, 124–138
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Control-ready architecture for self-testing in programmable logical matrix structures
Avtomat. i Telemekh., 2010, no. 12, 154–165
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On functional diagnosis of discrete devices under imperfect data processing conditions
Probl. Upr., 2008, no. 5, 62–66
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The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS
Avtomat. i Telemekh., 2007, no. 1, 163–174
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Optimization of parallel-series self-testing for discrete devices
Avtomat. i Telemekh., 2004, no. 8, 156–173
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The exhaustive test generator based on a binary counter for a type of synchronous automaton with finite memory
Avtomat. i Telemekh., 2000, no. 10, 164–170
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Decomposition of discrete devices for testable transformation
Avtomat. i Telemekh., 1999, no. 7, 131–141
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Construction of an Exhausting Test for Automata with Finite Memory. II
Avtomat. i Telemekh., 1997, no. 5, 142–152
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Construction of an Exhausting Test for Automata with Finite Memory. I
Avtomat. i Telemekh., 1997, no. 4, 213–226
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Generation of an exhaustive test for automata with finite memory. I
Avtomat. i Telemekh., 1991, no. 4, 147–156
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Restoration in duplicated units by the method of data inversion
Avtomat. i Telemekh., 1987, no. 10, 144–153
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A diagnosis system for a multi-processor microcomputer
Avtomat. i Telemekh., 1984, no. 10, 150–157
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Necessary and sufficient conditions for design of completely checkable modulo $2$ convolution circuits
Avtomat. i Telemekh., 1979, no. 9, 126–135
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Design of self-checking built-in check circuits for automata with memory
Avtomat. i Telemekh., 1975, no. 7, 132–142
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A localization of multiple faults by group testing
Avtomat. i Telemekh., 0
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Sixth All-Union conference on technical diagnostics
Avtomat. i Telemekh., 1988, no. 12, 168–172
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