Romanova Vera Mikhailovna

Publications in Math-Net.Ru

1. High-resolution X-ray projection radiography of a pin cathode in a high-current vacuum diode using X-pinch radiation
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 103:5 (2016),  402–407
2. Stratification dynamics and the development of electrothermal instability at the wire explosion
   
   Zhurnal Tekhnicheskoi Fiziki, 83:8 (2013),  43–52
3. Investigations of the mega-ampere multiwire X pinch
   
   Pis'ma v Zh. Èksper. Teoret. Fiz., 87:7 (2008),  426–432
4. Precision measurements of the wavelengths of the Al XII 1snp¹P₁ – 1s^{2 1}S₀ (n =  6 – 12) lines in the emission spectra of laser and X-pinch plasmas
   
   Kvantovaya Elektronika, 23:4 (1996),  359–362
5. x-Ray spectroscopic investigation of the stabilisation of a plasma column in a composite Z pinch
   
   Kvantovaya Elektronika, 23:2 (1996),  137–142
6. Use of higher-order reflection from mica crystals in x-ray spectroscopic investigations at 0.1 — 0.3 nm
   
   Kvantovaya Elektronika, 22:1 (1995),  21–24
7. Dynamics of a plasma formed by exploding metal wires and insulator fibres
   
   Kvantovaya Elektronika, 21:2 (1994),  181–185
8. Investigating the characteristics of x radiation from a hot plasma by means of glass-capillary converters
   
   Kvantovaya Elektronika, 20:12 (1993),  1181–1184
9. Spectra of multiply charged nickel and copper ions in an X-pinch plasma
   
   Kvantovaya Elektronika, 20:5 (1993),  461–470
10. Generating collimated intense monochromatic beams of soft x radiation from an X-pinch in the wavelength region 0.4–1.0 nm by means of spherical crystal mirrors
    
    Kvantovaya Elektronika, 20:5 (1993),  457–460
11. X-pinch plasma as an optical pumping source for x-ray lasers
    
    Kvantovaya Elektronika, 20:3 (1993),  237–243
12. CO2-LASER INTERFEROMETRY OF EXPLOSION-EMISSION PLASMA IN A HEAVY-CURRENT MICROSECOND DIODE
    
    Zhurnal Tekhnicheskoi Fiziki, 54:2 (1984),  399–401


13. Errata to the article: Use of higher-order reflection from mica crystals in x-ray spectroscopic investigations at 0.1–0.3 nm
    
    Kvantovaya Elektronika, 22:5 (1995),  528