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Publications in Math-Net.Ru
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Estimate of test lenghts in Zhegalkin basis in the case of constant faults of type «1» at gate outputs
Diskr. Mat., 36:2 (2024), 3–10
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Some classes of easily testable circuits in the Zhegalkin basis
Diskr. Mat., 33:4 (2021), 3–10
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Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
Diskr. Mat., 31:2 (2019), 14–19
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Lower estimate of the length of the complete test in the basis $\{x|y\}$
Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015, no. 4, 49–51
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Synthesis of easily testable circuits over the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ for systems of Boolean functions
Diskr. Mat., 24:1 (2012), 70–78
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Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
Diskr. Mat., 22:3 (2010), 127–133
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Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2008, no. 5, 49–52
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Synthesis of easy tested diagrams in the basis $\{\&,\vee,\bar{\phantom{z}}\}$ for systems of functions from some classes
Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2007, no. 4, 68–72
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Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements
Diskr. Mat., 17:1 (2005), 129–140
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