Chukhovskii Feliks Nikolaevich

Publications in Math-Net.Ru

1. Lateral inhomogeneities of sapphire plates determined with the aid of X-ray and probe methods
   
   Zhurnal Tekhnicheskoi Fiziki, 90:3 (2020),  419–426
2. Correcting the characteristics of silicon photodiodes by ion implantation
   
   Fizika i Tekhnika Poluprovodnikov, 54:6 (2020),  557–563
3. Microstructure of Si crystals subjected to irradiation with high-energy H$^+$ ions and heat treatment by high-resolution three-crystal X-ray diffraction and transmission electron microscopy
   
   Fizika Tverdogo Tela, 61:10 (2019),  1754–1762
4. On change in the silicon crystal structure implanted with hydrogen ions during annealing based on three-crystal X-ray diffractometry data
   
   Fizika Tverdogo Tela, 61:8 (2019),  1437–1442
5. X-ray diagnostics of microstructure defects of silicon crystals irradiated by hydrogen ions
   
   Zhurnal Tekhnicheskoi Fiziki, 89:5 (2019),  731–736
6. X-ray diffraction study of internal stresses in quartz crystals by the inclination technique
   
   Fizika Tverdogo Tela, 33:6 (1991),  1740–1748
7. X-ray topographic visualization of elastic stress fields created by ultrasound in crystals
   
   Fizika Tverdogo Tela, 32:4 (1990),  1224–1226
8. Restoration of the phase of an x-ray wave diffracted by a layered monocrystal structure
   
   Dokl. Akad. Nauk SSSR, 309:1 (1989),  105–109
9. Determination of plastic strain in heterostructures from X-ray diffractometric data
   
   Fizika Tverdogo Tela, 31:9 (1989),  76–80
10. X-ray diffraction study of distorted surface layers of $\mathrm{Si} (111)$ and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model
    
    Fizika Tverdogo Tela, 31:4 (1989),  74–81
11. Determination of the discrepancy and of the stresses in the multilayer heterostructures of the $\mathrm{A}^\mathrm{III}\mathrm{B}^\mathrm{V}$ type
    
    Dokl. Akad. Nauk SSSR, 292:2 (1987),  354–356
12. A new type of interference bands in Bragg section topograms
    
    Fizika Tverdogo Tela, 29:5 (1987),  1608–1611
13. Experimental study and computer simulation of high temperature dislocation images in X-ray section topograms in $\mathrm{Si}$
    
    Fizika Tverdogo Tela, 29:5 (1987),  1392–1398
14. Experimental and theoretical study of Bragg reflection of X-rays from elastically bent silicon crystals
    
    Fizika Tverdogo Tela, 28:10 (1986),  2935–2940
15. X-ray incline diffraction method of crystal structure with uniformly distributed defects
    
    Fizika Tverdogo Tela, 27:6 (1985),  1911–1912
16. Solution of the Schr\"оdinger–Bethe equation for multiwave fast electron diffraction in perfect crystals
    
    Dokl. Akad. Nauk SSSR, 275:4 (1984),  865–869
17. X-ray incline diffraction method study of elastically stressed monocrystalline plates
    
    Fizika Tverdogo Tela, 26:7 (1984),  2019–2024
18. X-ray bragg diffraction on crystals with transition layers
    
    Fizika Tverdogo Tela, 26:5 (1984),  1319–1325
19. Small-angle scattering at X-ray reflection from surface of solids
    
    Fizika Tverdogo Tela, 25:4 (1983),  1211–1214
20. Solutions of one-dimensional Schrödinger equation with hardy-type potential. The $S$-matrix formalism
    
    TMF, 38:3 (1979),  380–387
21. Solution of the problem of X-ray projection topogram calculation
    
    Dokl. Akad. Nauk SSSR, 240:4 (1978),  836–838
22. Exact solution to the problem of dynamic Bragg diffraction of X-rays in an elastically bent thick crystal
    
    Dokl. Akad. Nauk SSSR, 238:1 (1978),  81–84
23. Dynamic diffraction focusing of X-rays by elastically bended crystal
    
    Dokl. Akad. Nauk SSSR, 228:5 (1976),  1087–1090
24. Diffraction of X-ray on a curved crystal
    
    Dokl. Akad. Nauk SSSR, 222:3 (1975),  599–602
25. The problem of image formation in X-ray optics
    
    UFN, 107:2 (1972),  229–265
26. X-ray optics
    
    UFN, 104:2 (1971),  331–332