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Ronzhin O I
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Electrochemical capacitance-voltage profiling of the free-carrier concentration in HEMT heterostructures based on InGaAs/AlGaAs/GaAs compounds
Fizika i Tekhnika Poluprovodnikov
,
45
:6 (2011),
829–835
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Steklov Math. Inst. of RAS
, 2026