Bogatyrenko V V

Publications in Math-Net.Ru

1. Measurement of surface recombination velocity and bulk lifetime in Si wafers by transient behavior of excess thermal emission
   
   Fizika i Tekhnika Poluprovodnikov, 45:1 (2011),  62–66
2. A technique for characterizing surface recombination in silicon wafers based on thermal-emission measurements
   
   Fizika i Tekhnika Poluprovodnikov, 44:3 (2010),  409–412