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Levin Mark Nikolaevich
Publications in Math-Net.Ru
Relaxation spectroscopy of deep levels in semiconductors: Laplace-DLTS method
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
36
:21 (2010),
61–69
Method for evaluating the parameters of radiation defects and predicting the radiation resistance of MOS transistors
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
36
:15 (2010),
38–44
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Steklov Math. Inst. of RAS
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