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Ovchinnikov A A
Publications in Math-Net.Ru
X-ray spectroscopic examination of thin HfO
$_2$
films ALD- and MOCVD-grown on the Si(100) surface
Zhurnal Tekhnicheskoi Fiziki
,
80
:7 (2010),
131–136
Spectroscopic investigations of the stability of porous silicon structure obtained by etching Si(100) in aqueous ammonium fluoride solution
Pisma v Zhurnal Tekhnicheskoi Fiziki
,
36
:3 (2010),
53–59
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