Sokolov Andrey Arianovich

Publications in Math-Net.Ru

1. Electrical properties of a SiC–Si multilayer structure
   
   Fizika i Tekhnika Poluprovodnikov, 48:6 (2014),  814–817
2. The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:12 (2012),  24–29
3. X-ray spectroscopic examination of thin HfO$_2$ films ALD- and MOCVD-grown on the Si(100) surface
   
   Zhurnal Tekhnicheskoi Fiziki, 80:7 (2010),  131–136
4. Spectroscopic investigations of the stability of porous silicon structure obtained by etching Si(100) in aqueous ammonium fluoride solution
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 36:3 (2010),  53–59