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Tikhonravov Aleksandr Vladimirovich

Publications in Math-Net.Ru

  1. Choosing the broadband monitoring algorithm for the deposition process of optical coatings with accounting for the self-compensation effect of errors

    Zh. Vychisl. Mat. Mat. Fiz., 65:4 (2025),  515–527
  2. Inverse Sturm–Liouville Problem and its application to inverse problems in thin film optics

    Num. Meth. Prog., 25:special issue (2024),  1–10
  3. Algorithm for controlling the process of spraying optical coatings based on sample broadband measurement data

    Sib. Zh. Ind. Mat., 26:3 (2023),  169–178
  4. Optimization of parameters of multilayer diffraction gratings using needle variations

    University proceedings. Volga region. Physical and mathematical sciences, 2022, no. 4,  56–68
  5. Comparative analysis of algorithms for solving inverse problems related to monochromatic monitoring the deposition of multilayer optical coatings

    Zh. Vychisl. Mat. Mat. Fiz., 61:9 (2021),  1528–1535
  6. Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of data analysis

    Sib. Zh. Ind. Mat., 23:2 (2020),  93–105
  7. Stable method for optical monitoring the deposition of multilayer optical coatings

    Zh. Vychisl. Mat. Mat. Fiz., 60:12 (2020),  2122–2130
  8. Computational approach to the investigation of the error self-compensation effect in the deposition of multilayer optical coatings

    Zh. Vychisl. Mat. Mat. Fiz., 60:6 (2020),  1045–1052
  9. A nonlocal algorithm for analyzing the data of monochromatic optical control in the process of multilayer coating deposition

    Num. Meth. Prog., 20:4 (2019),  471–480
  10. Comparison of algorithms for determining the thickness of optical coatings online

    Zh. Vychisl. Mat. Mat. Fiz., 59:3 (2019),  494–504
  11. Regularizing algorithms for the determination of thickness of deposited layers in optical coating production

    Eurasian Journal of Mathematical and Computer Applications, 6:4 (2018),  38–47
  12. Correlation of errors in optical coating production with broad band monitoring

    Num. Meth. Prog., 19:4 (2018),  439–448
  13. Effect of nanoparticles on the structure of thin films: atomistic simulation results

    Num. Meth. Prog., 19:2 (2018),  173–177
  14. Ring statistics in disordered solids: a parallel algorithm for clusters with hundred thousands of atoms

    Num. Meth. Prog., 18:4 (2017),  447–454
  15. Mechanical losses in glassy silicon dioxide: results of atomistic simulation

    Num. Meth. Prog., 18:4 (2017),  381–386
  16. Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics

    Zh. Vychisl. Mat. Mat. Fiz., 57:5 (2017),  867–875
  17. Surface roughness of thin film atomistic nanometer-size clusters

    Num. Meth. Prog., 17:4 (2016),  455–459
  18. An algorithm of high performance modeling of optical nanocoating deposition processes

    Num. Meth. Prog., 14:3 (2013),  323–327
  19. High performance modeling of modern deposition processes for optical coating nanotechnology

    Num. Meth. Prog., 13:4 (2012),  491–496
  20. Low-frequency approximation and the choice of optimal elastic parameters for two-layer blast protection jackets

    Num. Meth. Prog., 7:1 (2006),  23–35
  21. Stabilization of computational algorithms for the characterization of thin film coatings

    Num. Meth. Prog., 6:1 (2005),  109–117
  22. New uniqueness classes for determining the parameters of a stratified medium from its energy reflectance

    Zh. Vychisl. Mat. Mat. Fiz., 36:11 (1996),  162–172
  23. Non-local optimization method for multilayer optical systems

    Mat. Model., 7:8 (1995),  105–127
  24. Second-order optimization methods in the synthesis of multilayer coatings

    Zh. Vychisl. Mat. Mat. Fiz., 33:10 (1993),  1518–1535
  25. Uniqueness of the determination of the parameters of a layered medium from the reflection energy coefficient

    Zh. Vychisl. Mat. Mat. Fiz., 33:3 (1993),  428–438
  26. The scattering of plane wave on columnar structure of thin films

    Mat. Model., 3:9 (1991),  31–40
  27. An asymptotic approach to the synthesis of a semiconductor device

    Mat. Model., 1:9 (1989),  43–63
  28. Mathematical methods for analysis and synthesis of layered media

    Mat. Model., 1:7 (1989),  13–38
  29. Synthesis of absorbing layered media

    Zh. Vychisl. Mat. Mat. Fiz., 28:6 (1988),  887–900
  30. Stable method of solution of problems of synthesis of stratified media

    Dokl. Akad. Nauk SSSR, 283:3 (1985),  582–585
  31. Problems of optimal control connected with synthesis of laminar media

    Differ. Uravn., 21:9 (1985),  1516–1523
  32. Synthesis of stratified media with given amplitude-phase properties

    Zh. Vychisl. Mat. Mat. Fiz., 25:11 (1985),  1674–1688
  33. Amplitude-phase properties of spectral coefficients of stratified media

    Zh. Vychisl. Mat. Mat. Fiz., 25:3 (1985),  442–450
  34. Synthesis of optical coverings in oblique incidence of light

    Zh. Vychisl. Mat. Mat. Fiz., 23:4 (1983),  929–935
  35. Theoretically attainable exactness of the solution of a synthesis problem

    Zh. Vychisl. Mat. Mat. Fiz., 22:6 (1982),  1421–1433
  36. The synthesis of multilayer coverings

    Zh. Vychisl. Mat. Mat. Fiz., 14:1 (1974),  135–144

  37. Aleksei Georgievich Sveshnikov (on his sixtieth birthday)

    Uspekhi Mat. Nauk, 40:6(246) (1985),  163–164


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