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Tlostanov Yu. K.
Publications in Math-Net.Ru
On estimating the power of a subset of N-bit binary sequences with a given number of single logical transitions
News of the Kabardin-Balkar scientific center of RAS
, 2005, no. 1,
70–72
A compact testing method for digital devices that provides maximum control reliability
News of the Kabardin-Balkar scientific center of RAS
, 2005, no. 1,
64–69
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Steklov Math. Inst. of RAS
, 2026