Chudakov Evgenii Aleksandrovich

Publications in Math-Net.Ru

1. Maximizing the sensitivity of thin film metal-dielectric refractometers
   
   Optics and Spectroscopy, 133:8 (2025),  896–906
2. Optical characteristics of boron-doped silicon wafers after rapid thermal annealing
   
   Optics and Spectroscopy, 133:8 (2025),  874–880
3. $m$-Line method for reflectometry of ultrathin layers
   
   Zhurnal Tekhnicheskoi Fiziki, 94:2 (2024),  267–277
4. Ellipsometry of metallic films under the conditions of the anomalous skin effect
   
   Optics and Spectroscopy, 129:7 (2021),  889–898