Kushchenkov Stanislav Aleksandrovich

Publications in Math-Net.Ru

1. Layer-by-layer analysis of the thickness distribution of silicon dioxide in the structure SiO$_{2}$/Si(111) by inelastic electron scattering cross-section spectroscopy
   
   Fizika i Tekhnika Poluprovodnikov, 50:3 (2016),  344–349
2. New opportunities for quantitative analysis as applied to reflected electron energy loss spectroscopy of Fe/Si structures
   
   Zhurnal Tekhnicheskoi Fiziki, 81:5 (2011),  69–74