Golubkov S A

Publications in Math-Net.Ru

1. Effect of solid-state epitaxial recrystallization on defect density in ultrathin silicon-on-sapphire layers
   
   Fizika Tverdogo Tela, 61:12 (2019),  2349–2354
2. Defect formation and recrystallization mechanisms in silicon-on-sapphire films under ion irradiation
   
   Fizika i Tekhnika Poluprovodnikov, 48:4 (2014),  535–538
3. Fabrication of ultrafine silicon layers on sapphire
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:19 (2012),  83–89
4. Potential distribution in voltage terminating structures with floating $p$–$n$ junction rings of silicon radiation detectors
   
   Fizika i Tekhnika Poluprovodnikov, 45:4 (2011),  547–553