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Publications in Math-Net.Ru
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Features of SnO$_2$/Ga$_2$O$_3$/GaN/Al$_2$O$_3$ multilayer film domain structure
Pisma v Zhurnal Tekhnicheskoi Fiziki, 51:1 (2025), 33–36
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Simulating 2D-diffraction patterns of model gallium arsenide whisker crystals
Fizika Tverdogo Tela, 65:1 (2023), 98–105
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Crystals of the phenazine coordination polymer with the third order symmetry axis: formation, properties
Zhurnal Tekhnicheskoi Fiziki, 92:6 (2022), 815–821
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Studying LiFePO$_4$ powder samples via X-ray diffraction techniques using artificial neural networks
Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:14 (2022), 14–17
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X-ray study of the superstructure in heavily doped porous indium phosphide
Fizika i Tekhnika Poluprovodnikov, 52:1 (2018), 89–92
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X-ray studies of the domain formation in rocks under blasting
Fizika Tverdogo Tela, 58:11 (2016), 2248–2251
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Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review
Zhurnal Tekhnicheskoi Fiziki, 85:11 (2015), 1–29
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Investigation of microcrystalline silicon by the small-angle X-ray-scattering technique
Fizika i Tekhnika Poluprovodnikov, 49:8 (2015), 1078–1082
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Characterization of the structure of ultradispersed diamond using X-ray diffractometry and small-angle X-ray scattering
Fizika Tverdogo Tela, 56:11 (2014), 2265–2268
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Domain structure of GaN/SiC-based materials for semiconductor lasers
Fizika Tverdogo Tela, 55:10 (2013), 2035–2038
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New technique for EXAFS data processing and its application
Zhurnal Tekhnicheskoi Fiziki, 81:9 (2011), 134–139
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Innovations in X-ray-induced electron emission spectroscopy (XIEES)
Fizika i Tekhnika Poluprovodnikov, 44:6 (2010), 753–758
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