Spesivtsev Evgenii Vasil'evich

Publications in Math-Net.Ru

1. Optical properties of pyrolytic silicon nitride SiN$_x$ enriched with silicon
   
   Optics and Spectroscopy, 130:11 (2022),  1718–1722
2. Optical properties of ferroelectric films Hf$_x$Zr$_y$O$_2$ and La : Hf$_x$Zr$_y$O$_2$ according to ellipsometry data
   
   Optics and Spectroscopy, 130:3 (2022),  365–368
3. Structural changes in nanometer-thick silicon-on-insulator films during high-temperature annealing
   
   Fizika i Tekhnika Poluprovodnikov, 56:3 (2022),  320–327
4. Optical and electrochromic properties of thin films of ambipolar polyimides with pendant groups based on thioxanthenone derivatives
   
   Optics and Spectroscopy, 129:11 (2021),  1393–1399
5. Optical properties of thin films of SiO$_{x}$ $(x<2)$, obtained by exposure of thermal silicon dioxide in hydrogen plasma
   
   Optics and Spectroscopy, 128:10 (2020),  1467–1472
6. The use of spectral ellipsometry and Raman spectroscopy in the screening diagnosis of colorectal cancer
   
   Optics and Spectroscopy, 127:1 (2019),  170–176
7. Anodic oxidation of hydrogen-transferred silicon-on-insulator layers
   
   Fizika i Tekhnika Poluprovodnikov, 53:2 (2019),  253–257
8. Optical properties of thin films of zinc phthalocyanines determined by spectroscopic ellipsometry
   
   Optics and Spectroscopy, 125:6 (2018),  825–829
9. Contactless transfer of image via the gas phase in a thermoactivated process
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:18 (2014),  8–15
10. Anodization of nanoscale Si layers in silicon-on-insulator structures
    
    Fizika i Tekhnika Poluprovodnikov, 45:8 (2011),  1121–1125
11. Monitoring the composition of the Cd$_{1-z}$Zn$_z$Te heteroepitaxial layers by spectroscopic ellipsometry
    
    Fizika i Tekhnika Poluprovodnikov, 44:1 (2010),  62–68