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Publications in Math-Net.Ru
Effect of dopant on piezoelectric and dielectric properties of thin films Bi
$_{3.25}$
La
$_{0.75}$
Ti
$_{3-x}$
A
$_x$
O
$_{12}$
(
$A$
– Ìn, Zr, Nb)
Fizika Tverdogo Tela
,
64
:10 (2022),
1483–1488
Determination of the parameters of metal–insulator–semiconductor structures with ultrathin insulating layer from high-frequency capacitance–voltage measurements
Fizika i Tekhnika Poluprovodnikov
,
53
:1 (2019),
46–49
Manifestation of excess centers of electron-hole pair generation resulting from field and thermal stresses and their subsequent annihilation in dynamic current-voltage characteristics of Si-MOS structures with ultrathin oxide
Fizika i Tekhnika Poluprovodnikov
,
45
:7 (2011),
974–979
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Steklov Math. Inst. of RAS
, 2026