Afanasiev Mikhail Sergeevich

Publications in Math-Net.Ru

1. Reliability of MIS structures based on films of barium strontium titanate and hafnium oxide
   
   Fizika Tverdogo Tela, 67:10 (2025),  1928–1931
2. Influence of the upper electrode material on the electrophysical properties of MDM structures based on ferroelectric films
   
   Fizika Tverdogo Tela, 65:6 (2023),  1060–1064
3. Formation and study of metal-insulator-semiconductor structures based on hafnium oxide films
   
   Fizika Tverdogo Tela, 65:4 (2023),  572–576
4. Creation and investigation of metal–dielectric–semiconductor structures based on ferroelectric films
   
   Fizika Tverdogo Tela, 62:3 (2020),  422–426
5. Conductivity of metal–dielectric–semiconductor structures based on ferroelectric films
   
   Fizika Tverdogo Tela, 62:1 (2020),  121–124
6. Dependence of the electrophysical characteristics of metal–ferroelectric–semiconductor structures on the field-electrode material
   
   Fizika i Tekhnika Poluprovodnikov, 54:11 (2020),  1219–1223
7. Ion-beam and X-ray methods of elemental diagnostics of thin film coatings
   
   Fizika Tverdogo Tela, 61:12 (2019),  2454–2460
8. The effect of synthesis temperature on the microstructure and electrophysical properties of BST 80/20 films
   
   Fizika Tverdogo Tela, 61:10 (2019),  1948–1952
9. The influence of the substrate material on the structure and electrophysical properties of Ba$_{x}$Sr$_{1-x}$TiO$_{3}$ thin films
   
   Fizika Tverdogo Tela, 60:5 (2018),  951–954
10. Optical monitoring of the deposition process of ferroelectric films
    
    Fizika Tverdogo Tela, 57:7 (2015),  1354–1357
11. Growth kinetics of induced domains in Ba$_{0.8}$Sr$_{0.2}$TiO$_3$ ferroelectric thin films
    
    Fizika Tverdogo Tela, 57:6 (2015),  1134–1137
12. Calculation of thermal parameters and technology of formation MPL microwave range
    
    Izv. Sarat. Univ. Physics, 13:1 (2013),  9–12
13. Voltage-capacitance characteristics of MFS-structures based on ferroelectric films
    
    Izv. Sarat. Univ. Physics, 13:1 (2013),  7–9
14. Determining parameters of planar capacitors based of thin film ferroelectric materials
    
    Izv. Sarat. Univ. Physics, 12:2 (2012),  8–11