Mokrushina Svetlana Andreena

Publications in Math-Net.Ru

1. Model of behavior of MOS structures during radiation-thermal treatments
   
   Zhurnal Tekhnicheskoi Fiziki, 94:11 (2024),  1843–1847
2. Effect of ionizing radiation on charge distribution and breakdown of mosfets
   
   Fizika i Tekhnika Poluprovodnikov, 56:2 (2022),  250–253
3. Model of the effect of the gate bias on MOS structures under ionizing radiation
   
   Fizika i Tekhnika Poluprovodnikov, 54:2 (2020),  189–194
4. Model for charge accumulation in $n$- and $p$-MOS transistors during tunneling electron injection from a gate
   
   Fizika i Tekhnika Poluprovodnikov, 52:6 (2018),  637–642