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Publications in Math-Net.Ru
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4H-SiC photodiodes with micronanostructured receiving surface
Fizika i Tekhnika Poluprovodnikov, 59:1 (2025), 43–47
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Characteristics of a silicon carbide field emission array under pre-breakdown conditions
Zhurnal Tekhnicheskoi Fiziki, 93:4 (2023), 568–574
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Application of RIE-technology to control responsivity of 4H-SiC photodiodes
Fizika i Tekhnika Poluprovodnikov, 56:10 (2022), 997–1001
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On the formation of low-resistivity contacts for 4H-SiC bipolar devices
Fizika i Tekhnika Poluprovodnikov, 56:6 (2022), 607–610
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Determination of thickness and doping features of multilayer $4H$–$\mathrm{SiC}$ structures by frequency analysis of IR reflection spectra
Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:2 (2022), 34–36
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High-power 4$H$-SiC mosfet with an epitaxial buried channel
Fizika i Tekhnika Poluprovodnikov, 54:1 (2020), 79–84
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Method for increasing the carrier mobility in the channel of the 4$H$-SiC MOSFET
Fizika i Tekhnika Poluprovodnikov, 50:6 (2016), 839–842
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Specific features of the current–voltage characteristics of SiO$_{2}$/4$H$-SiC MIS structures with phosphorus implanted into silicon carbide
Fizika i Tekhnika Poluprovodnikov, 50:1 (2016), 103–105
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On the ion implantation of phosphorus as a method for the passivation of states at the interface between 4H-SiC and SiO$_2$ produced by thermal oxidation in dry oxygen
Fizika i Tekhnika Poluprovodnikov, 48:12 (2014), 1621–1625
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Effect of rapid thermal annealing on the current-voltage characteristics of 4H-SiC Schottky diodes
Fizika i Tekhnika Poluprovodnikov, 47:1 (2013), 83–86
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