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Publications in Math-Net.Ru
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Red glass absorbtion filters luminescence in IR spectrum region
Optics and Spectroscopy, 133:7 (2025), 741–746
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In memoriam of E.M. Kruglov and V.V. Filimonov Quantum yield of an avalanche silicon photodiode in the 114–170 and 210–1100 nm wavelength ranges
Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:5 (2022), 3–6
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Quantum yield of a silicon avalanche photodiode in the wavelength range of 120–170 nm
Zhurnal Tekhnicheskoi Fiziki, 90:8 (2020), 1386–1392
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Phosphorescence kinetics of singlet oxygen in HeLa cells suspension
Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:18 (2019), 33–36
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Spectral characteristics of the DMEM cell-culture medium
Zhurnal Tekhnicheskoi Fiziki, 88:9 (2018), 1344–1347
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Luminescence of Radachlorin photosensitizer in aqueous solution under excitation at 405 and 660 nm
Optics and Spectroscopy, 124:1 (2018), 51–55
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Features of experimental spectra of the laser plasma with a dense xenon gas-jet target in the extreme ultraviolet range
Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:22 (2017), 10–17
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Quantum efficiency of 4$H$-SiC detectors within the range of 114–400 nm
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:20 (2016), 73–78
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Crystallization of amorphous hydrogenated silicon ($a$-Si:H) films under irradiation with femtosecond laser pulses
Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:15 (2016), 36–42
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Studying the interaction of supersonic air flow with transverse discharge
Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:22 (2015), 82–88
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Photoresponse of a silicon multipixel photon counter in the vacuum ultraviolet range
Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:8 (2014), 23–29
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Start-phase ionization dynamics in the laser plasma at low gas target densities
Zhurnal Tekhnicheskoi Fiziki, 83:12 (2013), 80–86
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Photoresponse recovery in silicon photodiodes upon VUV irradiation
Fizika i Tekhnika Poluprovodnikov, 47:2 (2013), 178–181
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A study of vacuum-ultraviolet stability of silicon photodiodes
Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:17 (2012), 69–77
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Compact spectrometer for 5–30 nm wavelength range
Pisma v Zhurnal Tekhnicheskoi Fiziki, 37:21 (2011), 102–110
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