RUS  ENG
Full version
PEOPLE

Belov Aleksei Ivanovich

Publications in Math-Net.Ru

  1. Anisotropic scattering effects in YBCO thin films

    Fizika Tverdogo Tela, 67:7 (2025),  1254–1261
  2. Influence of oxygen vacancy concentration on the resistive switching parameters of ZrO$_2$(Y)-based memristor structures

    Zhurnal Tekhnicheskoi Fiziki, 95:9 (2025),  1733–1743
  3. Memristors for non-volatile resistive memory based on an Al$_2$O$_3$/ZrO$_2$(Y) dielectric bilayer

    Zhurnal Tekhnicheskoi Fiziki, 94:11 (2024),  1833–1842
  4. Investigation of the influence of heat treatment and electrical power on the main characteristics of thin-film thermistors with a layer structure

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 50:6 (2024),  19–22
  5. Planar (lateral) light-emitting diodes with Ge(Si) nanoislands embedded in a photonic crystal

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 49:22 (2023),  12–15
  6. Resistive switching of memristors based on stabilized zirconia by complex signals

    Fizika Tverdogo Tela, 62:4 (2020),  556–561
  7. Resistive switching in metal–oxide–semiconductor structures with GeSi nanoislands on a silicon substrate

    Zhurnal Tekhnicheskoi Fiziki, 90:10 (2020),  1741–1749
  8. Electrophysical characteristics of multilayer memristive nanostructures based on yttria-stabilized zirconia and tantalum oxide

    Zhurnal Tekhnicheskoi Fiziki, 90:2 (2020),  298–304
  9. Mechanisms of current transport and resistive switching in capacitors with yttria-stabilized hafnia layers

    Zhurnal Tekhnicheskoi Fiziki, 89:6 (2019),  927–934
  10. The effect of irradiation with Si$^{+}$ ions on the resistive switching of memristive structures based on yttria stabilized zirconia

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:14 (2019),  3–6
  11. Behavioral features of MIS memristors with a Si$_{3}$N$_{4}$ nanolayer fabricated on a conductive Si substrate

    Fizika i Tekhnika Poluprovodnikov, 52:12 (2018),  1436–1442
  12. Effect of boron impurity on the light-emitting properties of dislocation structures formed in silicon by Si$^{+}$ ion implantation

    Fizika i Tekhnika Poluprovodnikov, 52:7 (2018),  702–707
  13. Simulation of synaptic coupling of neuron-like generators via a memristive device

    Zhurnal Tekhnicheskoi Fiziki, 87:8 (2017),  1248–1254
  14. Formation of hexagonal 9$R$ silicon polytype by ion implantation

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:16 (2017),  87–92
  15. Change of immitance during electroforming and resistive switching in the metal-insulator-metal memristive structures based on SiO$_{x}$

    Zhurnal Tekhnicheskoi Fiziki, 86:5 (2016),  107–111
  16. Layer-by-layer composition and structure of silicon subjected to combined gallium and nitrogen ion implantation for the ion synthesis of gallium nitride

    Fizika i Tekhnika Poluprovodnikov, 50:2 (2016),  274–278
  17. Resistive switching in Au/SiO$_{x}$/TiN/Ti memristive structures with varied geometric parameters and stoichiometry of dielectric film

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:10 (2016),  17–24
  18. The effect of irradiation with H$^+$ and Ne$^+$ ions on resistive switching in metal–insulator–metal memristive structures based on SiO$_x$

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:19 (2015),  81–89
  19. Effect of ion irradiation on the structure and luminescence characteristics of porous silicon impregnated with tungsten-telluride glass doped by Er and Yb impurities

    Fizika Tverdogo Tela, 56:3 (2014),  607–610
  20. Effect of ion doping on the dislocation-related photoluminescence in Si$^+$-implanted silicon

    Fizika i Tekhnika Poluprovodnikov, 48:2 (2014),  212–216
  21. Resistive switching in metal-insulator-metal structures based on germanium oxide and stabilized zirconia

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:3 (2014),  12–19
  22. Influence of the ion synthesis and ion doping regimes on the effect of sensitization of erbium emission by silicon nanoclusters in silicon dioxide films

    Fizika Tverdogo Tela, 55:11 (2013),  2243–2249
  23. Chemical and phase compositions of silicon oxide films with nanocrystals prepared by carbon ion implantation

    Fizika Tverdogo Tela, 54:2 (2012),  370–377
  24. Peculiarities of the formation and properties of light-emitting structures based on ion-synthesized silicon nanocrystals in SiO$_2$ and matrices

    Fizika Tverdogo Tela, 54:2 (2012),  347–359
  25. Model of photoluminescence from ion-synthesized silicon nanocrystal arrays embedded in a silicon dioxide matrix

    Zhurnal Tekhnicheskoi Fiziki, 82:12 (2012),  63–66
  26. Photoluminescence of porous silicon saturated with tungsten-tellurite glass with rare-earth metal impurities

    Fizika Tverdogo Tela, 53:12 (2011),  2294–2298
  27. Formation and “white” photoluminescence of nanoclusters in SiO$_x$ films implanted with carbon ions

    Fizika i Tekhnika Poluprovodnikov, 44:11 (2010),  1498–1503


© Steklov Math. Inst. of RAS, 2026