|
|
Publications in Math-Net.Ru
-
Effect of strain on thermoEMF in the silicate glass doped with ruthenium dioxide
Zhurnal Tekhnicheskoi Fiziki, 95:7 (2025), 1375–1384
-
Peculiarities of photoelectron spectra of Ge implanted with Na$^+$ ions
Pisma v Zhurnal Tekhnicheskoi Fiziki, 49:1 (2023), 27–30
-
Adsorption of Ba atoms influences the composition, emission, and optical properties of CdS single crystals
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:12 (2021), 3–5
-
Effect of the Ba$^+$ ion implantation on the composition and electronic properties of MoO$_{3}$/Mo (111) films
Zhurnal Tekhnicheskoi Fiziki, 90:5 (2020), 831–834
-
Effect of the disordering of thin surface layers on the electronic and optical properties of Si(111)
Fizika i Tekhnika Poluprovodnikov, 54:11 (2020), 1211–1216
-
Crystal structure and band gap of nanoscale phases of Si formed at various depths of the near-surface region of SiO$_{2}$
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020), 32–34
-
Escape depth of secondary and photoelectrons from CdTe films with a Ba film
Zhurnal Tekhnicheskoi Fiziki, 89:7 (2019), 1115–1117
-
Electronic and optical properties of NiSi$_{2}$/Si nanofilms
Zhurnal Tekhnicheskoi Fiziki, 89:5 (2019), 759–761
-
The effect of the formation of silicides on the resistivity of silicon
Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:7 (2019), 49–51
-
Composition and structure of Ga$_{1-x}$Na$_{x}$As nanolayers produced near the GaAs surface by Na$^+$ implantation
Zhurnal Tekhnicheskoi Fiziki, 87:12 (2017), 1884–1886
-
Composition, morphology, and electronic structure of the nanophases created on the SiO$_{2}$ Surface by Ar$^{+}$ ion bombardment
Zhurnal Tekhnicheskoi Fiziki, 86:4 (2016), 148–150
-
Electronic structure of Ga$_{1-x}$Al$_x$As nanostructures grown on the GaAs surface by ion implantation
Zhurnal Tekhnicheskoi Fiziki, 85:10 (2015), 148–151
-
Analysis of the structure and properties of heterostructured nanofilms prepared by epitaxy and ion implantation methods
Zhurnal Tekhnicheskoi Fiziki, 83:9 (2013), 146–149
-
Electron spectroscopy of the nanostructures created in Si, GaAs, and CaF$_2$ surface layers using low-energy ion implantation
Zhurnal Tekhnicheskoi Fiziki, 83:6 (2013), 66–70
© , 2026