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Kaptelov Evgenii Yur'evich

Publications in Math-Net.Ru

  1. Change in the rotation speed of the crystal lattice in spherulitic thin films with increasing their thickness

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 52:3 (2026),  37–40
  2. Deformation of the crystal lattice during the formation of a spherulite microstructure in thin films of lead zirconate

    Fizika Tverdogo Tela, 67:5 (2025),  861–865
  3. Features of electronic images of spherulitic islands in thin PZT films

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 51:5 (2025),  3–6
  4. Polar properties of spherulitic lead zirconate titanate thin films obtained by high temperature annealing from the amorphous phase

    Fizika Tverdogo Tela, 66:11 (2024),  1957–1963
  5. Microstructure of spherulitic lead zirconate titanate thin films

    Fizika Tverdogo Tela, 65:8 (2023),  1368–1374
  6. Ferroelectric properties of lead zirconate titanate thin films obtained by RF magnetron sputtering near the morphotropic phase boundary

    Fizika Tverdogo Tela, 65:2 (2023),  296–301
  7. Radially oriented lateral self-polarization in spherulitic lead zirconate titanate thin films

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 49:22 (2023),  8–11
  8. Structure and properties of composites based on aluminum and gallium nitrides grown on silicon of different orientations with a buffer layer of silicon carbide

    Fizika Tverdogo Tela, 64:5 (2022),  522–527
  9. An influence of mechanical stresses on the magnitude of the internal field in lead zirconate titanate thin films

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:15 (2022),  41–44
  10. Dielectric and pyroelectric properties of composites based on aluminum and gallium nitrides grown by chloride-hydride epitaxy on a silicon carbide-on-silicon substrate

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:9 (2021),  7–10
  11. Influence of orientation of a silicon substrate with a buffer silicon carbide layer on dielectric and polar properties of aluminum nitride films

    Fizika Tverdogo Tela, 61:12 (2019),  2379–2384
  12. Surface morphology, microstructure, and piezoelectric response of perovskite islands in lead zirconate titanate thin films

    Fizika Tverdogo Tela, 61:12 (2019),  2369–2374
  13. The element composition variation in lead zirconate titanate upon the ion-plasma deposition: experiment and simulation

    Fizika Tverdogo Tela, 61:7 (2019),  1282–1286
  14. Peculiarities of the structure and properties of thin PZT films with strongly nonuniform depth–composition profiles

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:16 (2019),  41–44
  15. Studying the composition and phase state of thin PZT films obtained by high-frequency magnetron sputtering under variation of working gas pressure

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:6 (2019),  3–6
  16. Influence of high-temperature annealing on the orientation of the unipolarity vector in lead zirconate titanate thin films

    Fizika Tverdogo Tela, 58:11 (2016),  2242–2247
  17. Pyroelectric and piezoelectric responses of thin AlN films epitaxy-grown on a SiC/Si substrate

    Fizika Tverdogo Tela, 58:5 (2016),  937–940
  18. The structure and dielectric properties of thin barium zirconate titanate films obtained by RF magnetron sputtering

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:3 (2016),  61–67
  19. Internal field and self-polarization in lead zirconate titanate thin films

    Fizika Tverdogo Tela, 57:9 (2015),  1748–1754
  20. Pyroelectric and piezoelectric properties of thin PZT films at the morphotropic phase boundary

    Fizika Tverdogo Tela, 56:4 (2014),  687–691
  21. Relaxor properties of single crystals of Na$_{1/2}$Bi$_{1/2}$TiO$_3$–KTaO$_3$

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:8 (2014),  50–55
  22. Anomalous losses of lead in crystallization of the perovskite phase in thin PZT films

    Fizika Tverdogo Tela, 55:1 (2013),  92–94
  23. Effect of lead oxide on the dielectric characteristics of heterogeneous Pb(Zr, Ti)O$_3$ + PbO films obtained by a two-stage method

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:4 (2013),  86–94
  24. Peculiarities of crystallization of thin ferroelectric films of lead zirconate titanate

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 37:4 (2011),  37–43
  25. Crystallization of thin polycrystalline PZT films on Si/SiO$_2$/Pt substrates

    Fizika Tverdogo Tela, 52:1 (2010),  124–128


© Steklov Math. Inst. of RAS, 2026