Publications in Math-Net.Ru
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Applicability of white light interferometers for measuring the roughness of X-ray optical elements
Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025), 1887–1897
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Application of cerium oxide nanopowders for silicon polishing
Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1588–1596
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Investigation of supersmooth optical surfaces and multilayer elements using soft X-ray radiation
Zhurnal Tekhnicheskoi Fiziki, 83:9 (2013), 134–142
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Multilayer X-ray mirrors based on La/B$_4$C and La/B$_9$C
Zhurnal Tekhnicheskoi Fiziki, 80:8 (2010), 93–100
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Detecting quasi-periodic $\{11n\}$, $n$ = 7–11 faces in samples with Ge/Si quantum dots by grazing X-ray reflectometry
Pisma v Zhurnal Tekhnicheskoi Fiziki, 36:3 (2010), 31–38
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