Mikhailenko Mikhail Sergeevich

Publications in Math-Net.Ru

1. Double-mirror monochromator for the 4+ generation “SKIF” synchrotron light source
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1963–1972
2. Kirkpatrick–Baez focusing system for synchrotron applications
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1954–1962
3. Applicability of white light interferometers for measuring the roughness of X-ray optical elements
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1887–1897
4. Ion beam machine for correction and aspherization of the surface shape of optical elements UIP-300
   
   Zhurnal Tekhnicheskoi Fiziki, 95:9 (2025),  1825–1835
5. Investigation of the angular dependences of the velocities of ion-beam sputtering of metals for the synthesis of mask blanks
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1051–1053
6. Study of the effect of neon ion energy on the surface roughness of the main cuts of monocrystalline silicon during ion etching
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1046–1050
7. The coating a liquid glass of the optical element substrates and its molecular composition
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1037–1045
8. Substrates for soft X-ray microscopy based on Si$_3$N$_4$ membranes
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1032–1036
9. Off-axis aspherical collector for EUV-lithography and SXR microscopy
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  963–967
10. Prospects for the use of reactive ion-beam etching of fused quartz with a mixture of tetrafluoromethane and argon for aspherizing the surface of optical elements
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1248–1252
11. Diamond-carbide-silicon composite “skeleton” as a promising material for X-ray optical substrates
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1238–1242
12. Model of physical sputtering of amorphous materials
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1230–1237
13. Study of the influence of the energy of argon ions on the surface roughness of the main sections of single-crystal silicon
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1219–1223
14. Wavefront lens corrector for studying flat surfaces
    
    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1583–1587
15. Ion-beam methods for high-precision processing of optical surfaces
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1922–1930
16. Material surface treatment for design of composite optical elements
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1913–1916
17. Modification and polishing of the holographic diffraction grating grooves by a neutralized Ar ion beam
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1864–1869
18. The diffraction efficiency of echelle gratings increased by ion-beam polishing of groove surfaces
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:16 (2016),  34–40