Rykhlitskii Sergei Vladimirovich

Publications in Math-Net.Ru

1. Temperature dependence of the spectra of optical constants of CdTe in the region of the absorption edge
   
   Optics and Spectroscopy, 131:9 (2023),  1213–1218
2. In situ ellipsometric control of growth processes of ZnTe and CdTe buffer layers in technology of molecular beam epitaxy of mercury cadmium telluride
   
   Fizika i Tekhnika Poluprovodnikov, 57:6 (2023),  469–475
3. Optical properties of pyrolytic silicon nitride SiN$_x$ enriched with silicon
   
   Optics and Spectroscopy, 130:11 (2022),  1718–1722
4. Optical properties of ferroelectric films Hf$_x$Zr$_y$O$_2$ and La : Hf$_x$Zr$_y$O$_2$ according to ellipsometry data
   
   Optics and Spectroscopy, 130:3 (2022),  365–368
5. Optical and electrochromic properties of thin films of ambipolar polyimides with pendant groups based on thioxanthenone derivatives
   
   Optics and Spectroscopy, 129:11 (2021),  1393–1399
6. Electrical and viscoelastic parameters of red blood cells in models for the diagnosis of adenomatous polyps and stages of colorectal cancer with optical detection of cells in non-uniform alternating electric field
   
   Optics and Spectroscopy, 129:6 (2021),  684–697
7. Atomic structure and optical properties of plasma enhanced chemical vapor deposited SiCOH Low-k dielectric film
   
   Optics and Spectroscopy, 129:5 (2021),  618
8. Investigation of the temperature dependence of the spectra of optical constants of Hg$_{1-x}$Cd$_{x}$Te films grown using molecular beam epitaxy
   
   Optics and Spectroscopy, 129:1 (2021),  33–40
9. In situ ellipsometric monitoring of composition and temperature of HgCdTe layers during their growth
   
   Fizika i Tekhnika Poluprovodnikov, 55:12 (2021),  1240–1247
10. Optical properties of (ZrO$_{2}$)$_{1-x}$(Y$_{2}$O$_{3}$)$_{x}$ ($x$ = 0–0.037) crystals grown by directional crystallization of the melt
    
    Optics and Spectroscopy, 128:12 (2020),  1830–1836
11. Parametric model of the optical constant spectra of Hg$_{1-x}$Cd$_{x}$Te and determination of the compound composition
    
    Optics and Spectroscopy, 128:12 (2020),  1815–1820
12. Optical properties of nonstoichiometric silicon oxide SiO$_{x}$ ($x<$ 2)
    
    Optics and Spectroscopy, 127:5 (2019),  769–773
13. The use of spectral ellipsometry and Raman spectroscopy in the screening diagnosis of colorectal cancer
    
    Optics and Spectroscopy, 127:1 (2019),  170–176
14. Ellipsometric method for measuring the CdTe buffer-layer temperature in the molecular-beam epitaxy of CdHgTe
    
    Fizika i Tekhnika Poluprovodnikov, 53:1 (2019),  137–142
15. Optical properties of thin films of zinc phthalocyanines determined by spectroscopic ellipsometry
    
    Optics and Spectroscopy, 125:6 (2018),  825–829
16. Ellipsometric technique for determining in situ the absorption coefficient of semiconducting nanolayers
    
    Zhurnal Tekhnicheskoi Fiziki, 84:5 (2014),  109–112
17. Analysis of the optical and structural properties of oxide films on InP using spectroscopic ellipsometry
    
    Zhurnal Tekhnicheskoi Fiziki, 83:11 (2013),  92–99
18. In situ investigations of magneto-optical properties of thin Fe layers
    
    Zhurnal Tekhnicheskoi Fiziki, 83:10 (2013),  139–142
19. Study of the morphology and optical properties of anodic oxide layers on InAs (111)III
    
    Fizika i Tekhnika Poluprovodnikov, 47:4 (2013),  532–537
20. Monitoring the composition of the Cd$_{1-z}$Zn$_z$Te heteroepitaxial layers by spectroscopic ellipsometry
    
    Fizika i Tekhnika Poluprovodnikov, 44:1 (2010),  62–68