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Publications in Math-Net.Ru
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Fluctuation analysis of the surface microrelief of silicon-on-insulator structures after radiation exposure
Fizika i Tekhnika Poluprovodnikov, 58:12 (2024), 668–675
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Silicon-on-insulator structures microtopography transformations features after photonic and corpuscular radiation exposure
Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023), 1025–1031
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Formation and properties of mesoporous MoS$_2$ films
Fizika i Tekhnika Poluprovodnikov, 56:12 (2022), 1112–1119
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Formation of nanostructured films based on MoS$_{2}$, WS$_{2}$, MoO$_{2}$ and their heterostructures
Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1509–1516
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Comparison of STM and AFM measurements of Mo thin films with the Kardar–Parisi–Zhang model
Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1466–1473
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Topology of PbSnTe:In layers versus indium concentration
Zhurnal Tekhnicheskoi Fiziki, 91:6 (2021), 1040–1044
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Experimental studies of modification of the characteristics of GaAs structures with Schottky contacts after exposure to fast neutrons
Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 846–849
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A comprehensive study of radiation defect clusters in GaAs structures after neutron irradiation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:5 (2021), 38–41
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Probe microscopy and electron-transport properties of thin mo epitaxial films on sapphire
Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1830–1837
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Formation of graphene on polycrystalline nickel
Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1756–1762
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