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Obolensky Sergei Vladimirovich

Publications in Math-Net.Ru

  1. Fluctuation analysis of the surface microrelief of silicon-on-insulator structures after radiation exposure

    Fizika i Tekhnika Poluprovodnikov, 58:12 (2024),  668–675
  2. Silicon-on-insulator structures microtopography transformations features after photonic and corpuscular radiation exposure

    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1025–1031
  3. Influence of single radiation defect cluster formation on transistor memory cell switching

    Fizika i Tekhnika Poluprovodnikov, 57:4 (2023),  270–275
  4. The influence of a single radiation defect cluster forming on the transistor structure channel conductivity

    Fizika i Tekhnika Poluprovodnikov, 56:7 (2022),  637–641
  5. Model for multiparametric analysis of parameters short-channel transistors of HEMT type

    Fizika i Tekhnika Poluprovodnikov, 56:7 (2022),  618–623
  6. Radiation hardness of subterahertz radiation source based on heterodyne on Gunn diode generator and superlattice multiplier

    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1501–1503
  7. Silicon metal–oxide–semiconductor transistor with a dependent pocket contact and two-layer polysilicon gate

    Fizika i Tekhnika Poluprovodnikov, 55:10 (2021),  916–921
  8. Effect of double recess technology on the parameters of HEMT transistors on GaAs and InP substrates

    Fizika i Tekhnika Poluprovodnikov, 55:10 (2021),  890–894
  9. Analysis of the effect of spacer layers on nonlinear distortions of the current–voltage characteristics of GaAlAs/InGaAs pHEMTs

    Fizika i Tekhnika Poluprovodnikov, 55:10 (2021),  872–876
  10. Experimental studies of modification of the characteristics of GaAs structures with Schottky contacts after exposure to fast neutrons

    Fizika i Tekhnika Poluprovodnikov, 55:10 (2021),  846–849
  11. Modeling the response of a microwave low-barrier uncooled Mott diode to the action of heavy ions of outer space and femtosecond laser pulses

    Fizika i Tekhnika Poluprovodnikov, 55:9 (2021),  743–747
  12. Study of nitrogen ion implantation through Si$_3$N$_4$ layer for GaN on Si power hemts isolation process

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:18 (2021),  15–17
  13. Simulation of the response of a low-barrier Mott diode to the influence of heavy charged particles from outer space

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:6 (2021),  51–54
  14. A comprehensive study of radiation defect clusters in GaAs structures after neutron irradiation

    Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:5 (2021),  38–41
  15. Secondary-ion mass spectroscopy for analysis of the implanted hydrogen profile in silicon and impurity composition of silicon-on-insulator structures

    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1850–1853
  16. Comparison of the efficiency of promising heterostructure frequency-multiplier diodes of the THz-frequency range

    Fizika i Tekhnika Poluprovodnikov, 54:10 (2020),  1158–1162
  17. Compensation for the nonlinearity of the drain–gate I–V characteristic in field-effect transistors with a gate length of $\sim$100 nm

    Fizika i Tekhnika Poluprovodnikov, 54:9 (2020),  968–973
  18. Impact of the potential of scattering at radiation-induced defects on carrier transport in GaAs structures

    Fizika i Tekhnika Poluprovodnikov, 54:9 (2020),  945–951
  19. On heating and relaxation of the electron–hole-gas energy in the track of a primary recoil atom

    Fizika i Tekhnika Poluprovodnikov, 54:8 (2020),  791–795
  20. Comparison of the radiation resistance of prospective bipolar and heterobipolar transistors

    Fizika i Tekhnika Poluprovodnikov, 53:10 (2019),  1391–1394
  21. Simulation of the formation of a cascade of displacements and transient ionization processes in silicon semiconductor structures under neutron exposure

    Fizika i Tekhnika Poluprovodnikov, 53:9 (2019),  1279–1284
  22. Numerical simulation of the current–voltage characteristics of bilayer resistive memory based on non-stoichiometric metal oxides

    Fizika i Tekhnika Poluprovodnikov, 53:9 (2019),  1275–1278
  23. Computational and experimental simulation of static memory cells of submicron microcircuits under the effect of neutron fluxes

    Fizika i Tekhnika Poluprovodnikov, 53:9 (2019),  1250–1256
  24. Investigation into the radiation hardness of photodiodes based on silicon-on-sapphire structures

    Fizika i Tekhnika Poluprovodnikov, 53:3 (2019),  388–395
  25. Analysis of the behavior of nonequilibrium semiconductor structures and microwave transistors during and after pulsed $\gamma$- and $\gamma$-neutron irradiation

    Fizika i Tekhnika Poluprovodnikov, 52:12 (2018),  1414–1420
  26. Development of a physical-topological model for the response of a high-power vertical DMOS transistor to the effect of pulsed gamma-radiation

    Fizika i Tekhnika Poluprovodnikov, 52:11 (2018),  1366–1372
  27. Application of the locally nonequilibrium diffusion-drift Cattaneo–Vernotte model to the calculation of photocurrent relaxation in diode structures under subpicosecond pulses of ionizing radiation

    Fizika i Tekhnika Poluprovodnikov, 52:11 (2018),  1295–1299
  28. Analysis of the GaN-HEMT parameters before and after gamma-neutron irradiation

    Fizika i Tekhnika Poluprovodnikov, 51:11 (2017),  1543–1546
  29. Degradation of the characteristics of GaAs bipolar transistors with a thin base due to the formation in them of nanometer-sized clusters of radiation-induced defects as a result of irradiation with neutrons

    Fizika i Tekhnika Poluprovodnikov, 51:11 (2017),  1520–1524
  30. Optimization of the superlattice parameters for THz diodes

    Fizika i Tekhnika Poluprovodnikov, 51:11 (2017),  1493–1497
  31. Transport of hot charge carriers in Si, GaAs, InGaAs, and GaN submicrometer semiconductor structures with nanometer-scale clusters of radiation-induced defects

    Fizika i Tekhnika Poluprovodnikov, 51:11 (2017),  1489–1492
  32. Effect of random inhomogeneities in the spatial distribution of radiation-induced defect clusters on carrier transport through the thin base of a heterojunction bipolar transistor upon neutron irradiation

    Fizika i Tekhnika Poluprovodnikov, 50:12 (2016),  1706–1712
  33. Microwave-signal generation in a planar Gunn diode with radiation exposure taken into account

    Fizika i Tekhnika Poluprovodnikov, 50:12 (2016),  1605–1609
  34. Theoretical and experimental studies of the current–voltage and capacitance–voltage of HEMT structures and field-effect transistors

    Fizika i Tekhnika Poluprovodnikov, 50:12 (2016),  1599–1604
  35. Simulation of electron transport in GaAs/AlAs superlattices with a small number of periods for the THz frequency range

    Fizika i Tekhnika Poluprovodnikov, 50:11 (2016),  1548–1553
  36. Study of the electron distribution in GaN and GaAs after $\gamma$-neutron irradiation

    Fizika i Tekhnika Poluprovodnikov, 50:3 (2016),  331–338
  37. High-frequency detection of the formation and stabilization of a radiation-induced defect cluster in semiconductor structures

    Fizika i Tekhnika Poluprovodnikov, 49:12 (2015),  1585–1592
  38. On the radiation resistance of planar Gunn diodes with $\delta$-doped layers

    Fizika i Tekhnika Poluprovodnikov, 49:11 (2015),  1507–1515
  39. Transport of charge carriers through the thin base of a heterobipolar transistor under the impact of radiation

    Fizika i Tekhnika Poluprovodnikov, 49:1 (2015),  71–75
  40. Modeling of powerful HEMT under high energy radiation

    Fizika i Tekhnika Poluprovodnikov, 46:12 (2012),  1587–1592
  41. Natural fluctuations in tunneling-current distribution over the area of a reverse-biased silicon $p$$n$ junction

    Fizika i Tekhnika Poluprovodnikov, 46:1 (2012),  134–139
  42. Comparative analysis of radiation effects on the electroluminescence of Si and SiGe/Si(001) heterostructures with self-assembled Islands

    Fizika i Tekhnika Poluprovodnikov, 45:2 (2011),  230–234
  43. Electrical and luminescence properties of silicon-based tunnel transit-time light-emitting diodes $p^+/n^+/n$-Si:Er

    Fizika i Tekhnika Poluprovodnikov, 44:11 (2010),  1533–1538
  44. Effect of irradiation on the luminescence properties of low-dimensional SiGe/Si(001) heterostructures

    Fizika i Tekhnika Poluprovodnikov, 44:3 (2010),  346–351


© Steklov Math. Inst. of RAS, 2026