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Publications in Math-Net.Ru
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Fluctuation analysis of the surface microrelief of silicon-on-insulator structures after radiation exposure
Fizika i Tekhnika Poluprovodnikov, 58:12 (2024), 668–675
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Silicon-on-insulator structures microtopography transformations features after photonic and corpuscular radiation exposure
Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023), 1025–1031
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Influence of single radiation defect cluster formation on transistor memory cell switching
Fizika i Tekhnika Poluprovodnikov, 57:4 (2023), 270–275
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The influence of a single radiation defect cluster forming on the transistor structure channel conductivity
Fizika i Tekhnika Poluprovodnikov, 56:7 (2022), 637–641
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Model for multiparametric analysis of parameters short-channel transistors of HEMT type
Fizika i Tekhnika Poluprovodnikov, 56:7 (2022), 618–623
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Radiation hardness of subterahertz radiation source based on heterodyne on Gunn diode generator and superlattice multiplier
Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1501–1503
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Silicon metal–oxide–semiconductor transistor with a dependent pocket contact and two-layer polysilicon gate
Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 916–921
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Effect of double recess technology on the parameters of HEMT transistors on GaAs and InP substrates
Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 890–894
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Analysis of the effect of spacer layers on nonlinear distortions of the current–voltage characteristics of GaAlAs/InGaAs pHEMTs
Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 872–876
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Experimental studies of modification of the characteristics of GaAs structures with Schottky contacts after exposure to fast neutrons
Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 846–849
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Modeling the response of a microwave low-barrier uncooled Mott diode to the action of heavy ions of outer space and femtosecond laser pulses
Fizika i Tekhnika Poluprovodnikov, 55:9 (2021), 743–747
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Study of nitrogen ion implantation through Si$_3$N$_4$ layer for GaN on Si power hemts isolation process
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:18 (2021), 15–17
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Simulation of the response of a low-barrier Mott diode to the influence of heavy charged particles from outer space
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:6 (2021), 51–54
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A comprehensive study of radiation defect clusters in GaAs structures after neutron irradiation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:5 (2021), 38–41
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Secondary-ion mass spectroscopy for analysis of the implanted hydrogen profile in silicon and impurity composition of silicon-on-insulator structures
Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1850–1853
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Comparison of the efficiency of promising heterostructure frequency-multiplier diodes of the THz-frequency range
Fizika i Tekhnika Poluprovodnikov, 54:10 (2020), 1158–1162
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Compensation for the nonlinearity of the drain–gate I–V characteristic in field-effect transistors with a gate length of $\sim$100 nm
Fizika i Tekhnika Poluprovodnikov, 54:9 (2020), 968–973
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Impact of the potential of scattering at radiation-induced defects on carrier transport in GaAs structures
Fizika i Tekhnika Poluprovodnikov, 54:9 (2020), 945–951
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On heating and relaxation of the electron–hole-gas energy in the track of a primary recoil atom
Fizika i Tekhnika Poluprovodnikov, 54:8 (2020), 791–795
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Comparison of the radiation resistance of prospective bipolar and heterobipolar transistors
Fizika i Tekhnika Poluprovodnikov, 53:10 (2019), 1391–1394
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Simulation of the formation of a cascade of displacements and transient ionization processes in silicon semiconductor structures under neutron exposure
Fizika i Tekhnika Poluprovodnikov, 53:9 (2019), 1279–1284
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Numerical simulation of the current–voltage characteristics of bilayer resistive memory based on non-stoichiometric metal oxides
Fizika i Tekhnika Poluprovodnikov, 53:9 (2019), 1275–1278
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Computational and experimental simulation of static memory cells of submicron microcircuits under the effect of neutron fluxes
Fizika i Tekhnika Poluprovodnikov, 53:9 (2019), 1250–1256
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Investigation into the radiation hardness of photodiodes based on silicon-on-sapphire structures
Fizika i Tekhnika Poluprovodnikov, 53:3 (2019), 388–395
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Analysis of the behavior of nonequilibrium semiconductor structures and microwave transistors during and after pulsed $\gamma$- and $\gamma$-neutron irradiation
Fizika i Tekhnika Poluprovodnikov, 52:12 (2018), 1414–1420
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Development of a physical-topological model for the response of a high-power vertical DMOS transistor to the effect of pulsed gamma-radiation
Fizika i Tekhnika Poluprovodnikov, 52:11 (2018), 1366–1372
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Application of the locally nonequilibrium diffusion-drift Cattaneo–Vernotte model to the calculation of photocurrent relaxation in diode structures under subpicosecond pulses of ionizing radiation
Fizika i Tekhnika Poluprovodnikov, 52:11 (2018), 1295–1299
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Analysis of the GaN-HEMT parameters before and after gamma-neutron irradiation
Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1543–1546
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Degradation of the characteristics of GaAs bipolar transistors with a thin base due to the formation in them of nanometer-sized clusters of radiation-induced defects as a result of irradiation with neutrons
Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1520–1524
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Optimization of the superlattice parameters for THz diodes
Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1493–1497
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Transport of hot charge carriers in Si, GaAs, InGaAs, and GaN submicrometer semiconductor structures with nanometer-scale clusters of radiation-induced defects
Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1489–1492
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Effect of random inhomogeneities in the spatial distribution of radiation-induced defect clusters on carrier transport through the thin base of a heterojunction bipolar transistor upon neutron irradiation
Fizika i Tekhnika Poluprovodnikov, 50:12 (2016), 1706–1712
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Microwave-signal generation in a planar Gunn diode with radiation exposure taken into account
Fizika i Tekhnika Poluprovodnikov, 50:12 (2016), 1605–1609
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Theoretical and experimental studies of the current–voltage and capacitance–voltage of HEMT structures and field-effect transistors
Fizika i Tekhnika Poluprovodnikov, 50:12 (2016), 1599–1604
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Simulation of electron transport in GaAs/AlAs superlattices with a small number of periods for the THz frequency range
Fizika i Tekhnika Poluprovodnikov, 50:11 (2016), 1548–1553
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Study of the electron distribution in GaN and GaAs after $\gamma$-neutron irradiation
Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 331–338
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High-frequency detection of the formation and stabilization of a radiation-induced defect cluster in semiconductor structures
Fizika i Tekhnika Poluprovodnikov, 49:12 (2015), 1585–1592
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On the radiation resistance of planar Gunn diodes with $\delta$-doped layers
Fizika i Tekhnika Poluprovodnikov, 49:11 (2015), 1507–1515
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Transport of charge carriers through the thin base of a heterobipolar transistor under the impact of radiation
Fizika i Tekhnika Poluprovodnikov, 49:1 (2015), 71–75
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Modeling of powerful HEMT under high energy radiation
Fizika i Tekhnika Poluprovodnikov, 46:12 (2012), 1587–1592
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Natural fluctuations in tunneling-current distribution over the area of a reverse-biased silicon $p$–$n$ junction
Fizika i Tekhnika Poluprovodnikov, 46:1 (2012), 134–139
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Comparative analysis of radiation effects on the electroluminescence of Si and SiGe/Si(001) heterostructures with self-assembled Islands
Fizika i Tekhnika Poluprovodnikov, 45:2 (2011), 230–234
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Electrical and luminescence properties of silicon-based tunnel transit-time light-emitting diodes $p^+/n^+/n$-Si:Er
Fizika i Tekhnika Poluprovodnikov, 44:11 (2010), 1533–1538
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Effect of irradiation on the luminescence properties of low-dimensional SiGe/Si(001) heterostructures
Fizika i Tekhnika Poluprovodnikov, 44:3 (2010), 346–351
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