Shvets Vasily Aleksandrovich

Publications in Math-Net.Ru

1. Influence of radiative heat transfer on growth temperature during epitaxy of HgCdTe layers
   
   Fizika i Tekhnika Poluprovodnikov, 59:3 (2025),  153–159
2. Temperature dependence of the spectra of optical constants of CdTe in the region of the absorption edge
   
   Optics and Spectroscopy, 131:9 (2023),  1213–1218
3. In situ ellipsometric control of growth processes of ZnTe and CdTe buffer layers in technology of molecular beam epitaxy of mercury cadmium telluride
   
   Fizika i Tekhnika Poluprovodnikov, 57:6 (2023),  469–475
4. Investigation of the temperature dependence of the spectra of optical constants of Hg$_{1-x}$Cd$_{x}$Te films grown using molecular beam epitaxy
   
   Optics and Spectroscopy, 129:1 (2021),  33–40
5. In situ ellipsometric monitoring of composition and temperature of HgCdTe layers during their growth
   
   Fizika i Tekhnika Poluprovodnikov, 55:12 (2021),  1240–1247
6. Formation of acceptor centers in CdHgTe as a result of water and heat treatments
   
   Fizika i Tekhnika Poluprovodnikov, 55:4 (2021),  331–335
7. Parametric model of the optical constant spectra of Hg$_{1-x}$Cd$_{x}$Te and determination of the compound composition
   
   Optics and Spectroscopy, 128:12 (2020),  1815–1820
8. A mask based on a Si epitaxial layer for the self-catalytic nanowire growth on GaAs (111)$B$ and GaAs (100) substrates
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:4 (2020),  11–14
9. Determination of the composition profile of HgTe/Cd$_{x}$Hg$_{1-x}$Te quantum wells by single wavelength ellipsometry
   
   Optics and Spectroscopy, 127:2 (2019),  318–324
10. Ellipsometric method for measuring the CdTe buffer-layer temperature in the molecular-beam epitaxy of CdHgTe
    
    Fizika i Tekhnika Poluprovodnikov, 53:1 (2019),  137–142
11. Ellipsometric technique for determining in situ the absorption coefficient of semiconducting nanolayers
    
    Zhurnal Tekhnicheskoi Fiziki, 84:5 (2014),  109–112
12. Analysis of the optical and structural properties of oxide films on InP using spectroscopic ellipsometry
    
    Zhurnal Tekhnicheskoi Fiziki, 83:11 (2013),  92–99
13. In situ investigations of magneto-optical properties of thin Fe layers
    
    Zhurnal Tekhnicheskoi Fiziki, 83:10 (2013),  139–142
14. Quick ellipsometric technique for determining the thicknesses and optical constant profiles of Fe/SiO$_2$/Si(100) nanostructures during growth
    
    Zhurnal Tekhnicheskoi Fiziki, 82:9 (2012),  44–48
15. Monitoring the composition of the Cd$_{1-z}$Zn$_z$Te heteroepitaxial layers by spectroscopic ellipsometry
    
    Fizika i Tekhnika Poluprovodnikov, 44:1 (2010),  62–68