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Publications in Math-Net.Ru
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Application of RIE-technology to control responsivity of 4H-SiC photodiodes
Fizika i Tekhnika Poluprovodnikov, 56:10 (2022), 997–1001
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On the formation of low-resistivity contacts for 4H-SiC bipolar devices
Fizika i Tekhnika Poluprovodnikov, 56:6 (2022), 607–610
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Determination of thickness and doping features of multilayer $4H$–$\mathrm{SiC}$ structures by frequency analysis of IR reflection spectra
Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:2 (2022), 34–36
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High-power 4$H$-SiC mosfet with an epitaxial buried channel
Fizika i Tekhnika Poluprovodnikov, 54:1 (2020), 79–84
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Comparative ellipsometric analysis of silicon carbide polytypes 4$H$, 15$R$, and 6$H$ produced by a modified Lely method in the same growth process
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:19 (2020), 28–31
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Investigation of the hardness and Young's modulus in thin near-surface layers of silicon carbide from the Si- and C-faces by nanoindentation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020), 36–38
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Frequency dependence of an electromagnetic absorption coefficient in magnetic fluid
Zhurnal Tekhnicheskoi Fiziki, 89:6 (2019), 948–951
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Formation of highly conductive and optically transparent multilayer graphene films by carbonization of polyimide Langmuir–Blodgett films
Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:9 (2019), 50–54
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Thermal-conductive boards based on aluminum with an Al$_{2}$O$_{3}$ nanostructured layer for products of power electronics
Zhurnal Tekhnicheskoi Fiziki, 88:11 (2018), 1678–1680
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Planarization of a surface of nanoporous silica–titania composition by atomic-molecular chemical assembly
Zhurnal Tekhnicheskoi Fiziki, 87:5 (2017), 736–740
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Method for increasing the carrier mobility in the channel of the 4$H$-SiC MOSFET
Fizika i Tekhnika Poluprovodnikov, 50:6 (2016), 839–842
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Specific features of the current–voltage characteristics of SiO$_{2}$/4$H$-SiC MIS structures with phosphorus implanted into silicon carbide
Fizika i Tekhnika Poluprovodnikov, 50:1 (2016), 103–105
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On the ion implantation of phosphorus as a method for the passivation of states at the interface between 4H-SiC and SiO$_2$ produced by thermal oxidation in dry oxygen
Fizika i Tekhnika Poluprovodnikov, 48:12 (2014), 1621–1625
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EVOLUTION REGULARITY OF CRYSTAL-STRUCTURES DURING THE SYNTHESIS OF
SUBSTANCES, CONTAINING A GREAT DEAL OF STRUCTURALLY STABLE CONDITIONS
Zhurnal Tekhnicheskoi Fiziki, 54:7 (1984), 1388–1390
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