Chertkov I L

Publications in Math-Net.Ru

1. Using the internal friction method to study defects in $\mathrm{Cr}$-doped and $\mathrm{Al}$-doped $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$
   
   Fizika Tverdogo Tela, 34:1 (1992),  225–231
2. Internal friction in $\mathrm{Bi}_{12}\mathrm{GeO}_{20}$ and $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$ associated with electronic state
   
   Fizika Tverdogo Tela, 29:1 (1987),  228–230
3. Internal friction peak due to conductivity state in $\mathrm{Bi}_{12}\mathrm{GeO}_{20}$
   
   Fizika Tverdogo Tela, 26:3 (1984),  928–929