Publications in Math-Net.Ru
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Wear of the probe tip depending on the interaction regimes with the sample surface at operating in the amplitude-modulation atomic force microscopy mode
Pisma v Zhurnal Tekhnicheskoi Fiziki, 50:15 (2024), 25–29
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Interface localization of the Wannier–Mott exciton in the organic-semiconductor structure “Langmuir film/CdS”
Fizika Tverdogo Tela, 61:7 (2019), 1362–1367
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Evolution of morphology of surface during film growth of polycrystalline silicon with hemispherical grains
Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:13 (2014), 18–26
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Roughness of amorphous, polycrystalline and hemispherical-grained silicon films
Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:19 (2013), 32–40
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Multi-layer Langmuir films for optoelectronics and the nonlinear-optical method of their investigation
Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:10 (1985), 599–601
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Piezoelectric effect in multi-layered Langmuir films
Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:7 (1985), 385–388
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