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Publications in Math-Net.Ru
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LED structures based on ZnO films obtained by RF magnetron sputtering for the UV spectral range
Zhurnal Tekhnicheskoi Fiziki, 90:3 (2020), 456–461
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Parameters of ZnO semiconductor films doped with Mn and Fe 3$d$ impurities
Fizika i Tekhnika Poluprovodnikov, 54:1 (2020), 18–21
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Growth and structural, magnetic, and magnetooptical properties of ZnO films doped with a Fe$^{57}$ 3$d$ impurity
Fizika Tverdogo Tela, 60:3 (2018), 596–602
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Influence of silver and gold nanoparticles and thin layers on charge carrier generation in InGaN/GaN multiple quantum well structures and crystalline zinc oxide films
Zhurnal Tekhnicheskoi Fiziki, 88:4 (2018), 566–571
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Formation of luminescence spectra and emission intensity in the UV and visible spectral regions for $n$-ZnO/$p$-GaN and $n$-ZnO/$p$-ZnO structures when depositing ZnO films by high-frequency magnetron sputtering
Fizika i Tekhnika Poluprovodnikov, 52:10 (2018), 1115–1119
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Parameters of ZnO films with $p$-type conductivity deposited by high-frequency magnetron sputtering
Fizika i Tekhnika Poluprovodnikov, 51:5 (2017), 588–593
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UV and IR emission intensity in ZnO films, nanorods, and bulk single crystals doped with Er and additionally introduced impurities
Fizika i Tekhnika Poluprovodnikov, 50:10 (2016), 1325–1332
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Photoinduced defects in $a$-Si:H Films and InGaN/GaN multiple quantum well structures doped with Eu, Sm, and Eu + Sm
Zhurnal Tekhnicheskoi Fiziki, 85:9 (2015), 97–104
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Effect of self-organization, defects, impurities, and autocatalytic processes on the parameters of ZnO films and nanorods
Fizika i Tekhnika Poluprovodnikov, 49:11 (2015), 1521–1530
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Emission intensity of the $\lambda$ = 1.54 $\mu$m line in ZnO films grown by magnetron sputtering, diffusion doped with Ce, Yb, Er
Fizika i Tekhnika Poluprovodnikov, 49:8 (2015), 1016–1023
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Influence of the magnetic field strength and excitation intensity on the shape of microphotoluminescence spectra of quantum-well structures based on GaN/InGaN doped with Sm and Eu+Sm
Fizika Tverdogo Tela, 55:5 (2013), 962–967
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Emission intensity in the visible and IR spectral ranges from Si-based structures formed by direct bonding with simultaneous doping with erbium (Er) and europium (Eu)
Fizika i Tekhnika Poluprovodnikov, 47:9 (2013), 1204–1209
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Metastable states in InGaN/GaN MQW structures doped with Sm, Eu, and Eu + Sm
Fizika i Tekhnika Poluprovodnikov, 47:4 (2013), 480–489
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Photoluminescence spectra of intracenter 4$f$ transitions of rare-earth metal dopants in crystalline ZnO films
Fizika Tverdogo Tela, 54:6 (2012), 1155–1163
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Influence of nanoparticles and thin layers of gold, europium phthalocyanine, and erbium nanoparticles on the formation of luminescence spectra of structures with InGaN/GaN quantum wells
Fizika Tverdogo Tela, 54:1 (2012), 182–188
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Intensity of emission from intracenter 4$f$-transitions in $a$-Si:H, ZnO, and GaN films doped with rare-earth ions
Fizika i Tekhnika Poluprovodnikov, 46:7 (2012), 925–936
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Influence of the magnetic field and measurement temperature on the shape of microphotoluminescence spectra of Eu-Doped InGaN/GaN quantum-well structures
Fizika Tverdogo Tela, 53:8 (2011), 1596–1603
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Setup for taking the radiation spectra of wideband semiconductors
Zhurnal Tekhnicheskoi Fiziki, 81:9 (2011), 77–81
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Photoluminescence of nitro-substituted europium (III) phthalocyanines
Fizika i Tekhnika Poluprovodnikov, 44:8 (2010), 1104–1107
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The effect of Fe, Cu, and Si impurities on the formation of emission spectra in bulk ZnO crystals
Fizika i Tekhnika Poluprovodnikov, 44:4 (2010), 445–451
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Emission sensitization and mechanisms of electron-excitation migration in structures based on III-nitrides doped with rare-earth elements (Eu, Er, Sm)
Fizika i Tekhnika Poluprovodnikov, 44:3 (2010), 338–345
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PARAMETERS OF PHOTOTRANSDUCERS BASED ON FILMS OF AMORPHOUS HYDRATED
SILICONE OBTAINED IN THE TETRODE SYSTEM
Zhurnal Tekhnicheskoi Fiziki, 62:1 (1992), 108–112
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Structural net of boron-doped $\alpha$-Si : H and hole transport
Fizika i Tekhnika Poluprovodnikov, 26:5 (1992), 960–962
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Photoconduction and state density of boron-doped amorphous hydrogenated silicon
Fizika i Tekhnika Poluprovodnikov, 26:1 (1992), 66–70
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Плотность состояний хвоста валентной зоны и фотопроводимость
аморфного гидрированного кремния
Fizika i Tekhnika Poluprovodnikov, 25:8 (1991), 1448–1450
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Удельные сдвиги носителей тока и плотность состояний аморфного
гидрированного кремния
Fizika i Tekhnika Poluprovodnikov, 25:3 (1991), 551–553
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Исследование фотопроводимости аморфного гидрированного кремния
методом видикона
Fizika i Tekhnika Poluprovodnikov, 25:1 (1991), 170–171
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Плотность состояний и перенос дырок в аморфном гидрированном кремнии
Fizika i Tekhnika Poluprovodnikov, 25:1 (1991), 102–105
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Mechanism of the anomalous spectral behavior of optical absorption in amorphous silicon
Fizika Tverdogo Tela, 32:5 (1990), 1515–1517
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Удельные сдвиги носителей заряда и фотопроводимость аморфного
гидрированного кремния
Fizika i Tekhnika Poluprovodnikov, 24:7 (1990), 1190–1193
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PHOTOSENSITIVITY OF P-I-N-STRUCTURES AND STRUCTURES WITH
SCHOTTKY-BARRIER BASED ON A-SI-H IN THE UV EMISSION DOMAIN
Pisma v Zhurnal Tekhnicheskoi Fiziki, 16:1 (1990), 47–50
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Эффект псевдолегирования аморфного кремния
Fizika i Tekhnika Poluprovodnikov, 23:10 (1989), 1737–1740
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Примесные центры диспрозия в аморфном гидрогенизированном кремнии
Fizika i Tekhnika Poluprovodnikov, 23:9 (1989), 1552–1555
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Структурная сетка, уровень Ферми и плотность состояний аморфного
кремния
Fizika i Tekhnika Poluprovodnikov, 23:3 (1989), 450–455
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TARGETS OF VIDICON BASED ON AMORPHOUS HYDROGENATED SILICONE
Pisma v Zhurnal Tekhnicheskoi Fiziki, 15:4 (1989), 85–87
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Легирование железом аморфного гидрогенизированного углерода
Fizika i Tekhnika Poluprovodnikov, 22:10 (1988), 1856–1859
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Электрофизические свойства контактов с барьером Шоттки
на аморфном гидрированном кремнии
Fizika i Tekhnika Poluprovodnikov, 22:3 (1988), 461–464
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Природа примесных состояний, образуемых переходными металлами
(железом и европием) в аморфном гидрированном кремнии
Fizika i Tekhnika Poluprovodnikov, 22:1 (1988), 161–164
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On the Doping of Amorphous Silicon
Fizika i Tekhnika Poluprovodnikov, 21:8 (1987), 1464–1466
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Mossbauer study of the iron impurity atoms in amorphous silicon
Fizika Tverdogo Tela, 28:8 (1986), 2543–2546
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State Density of Hydrogenated Amorphous Silicon
Fizika i Tekhnika Poluprovodnikov, 20:10 (1986), 1912–1914
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Influence of the temperature anneal on characteristics of solar elements with Schottky-barrier based on the amorphous hydrogenated silicon
Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:1 (1985), 28–31
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Плотность состояний и фотопроводимость аморфного кремния
Fizika i Tekhnika Poluprovodnikov, 18:10 (1984), 1897–1899
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On the Nature of Dark Currents in the Structures with Schottky Barriers Hydrogenated Silicon
Fizika i Tekhnika Poluprovodnikov, 18:2 (1984), 373–376
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О механизме проводимости аморфного кремния при гидрировании
Fizika i Tekhnika Poluprovodnikov, 17:7 (1983), 1255–1258
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