RUS  ENG
Full version
PEOPLE

Мnatsakanov Tigran Tigranovich

Publications in Math-Net.Ru

  1. Current–voltage characteristics of power diode structures with strong asymmetry of emitters injection ability

    Fizika i Tekhnika Poluprovodnikov, 55:6 (2021),  524–532
  2. High-power Schottky diodes with a negative-differential-resistance portion in the I–V characteristic

    Fizika i Tekhnika Poluprovodnikov, 55:1 (2021),  75–82
  3. S-shaped I – V characteristics of high-power Schottky diodes at high current densities

    Fizika i Tekhnika Poluprovodnikov, 54:5 (2020),  470–477
  4. Multidimensional $dU/dt$ effect in high-power thyristors

    Fizika i Tekhnika Poluprovodnikov, 54:1 (2020),  69–73
  5. Theoretical analysis of the effect of $dU/dt$ in 4H–SiC thyristor structures

    Zhurnal Tekhnicheskoi Fiziki, 88:10 (2018),  1544–1550
  6. Current–voltage characteristics of Schottky diodes at high current densities under the injection of minority carriers

    Fizika i Tekhnika Poluprovodnikov, 51:8 (2017),  1125–1130
  7. On the limit of the injection ability of silicon $p^{+}$$n$ junctions as a result of fundamental physical effects

    Fizika i Tekhnika Poluprovodnikov, 51:6 (2017),  830–834
  8. Analysis of the impact of non-1D effects on the gate switch-on current in 4$H$-SiC thyristors

    Fizika i Tekhnika Poluprovodnikov, 51:2 (2017),  234–239
  9. High-voltage silicon-carbide thyristor with an $n$-type blocking base

    Fizika i Tekhnika Poluprovodnikov, 50:3 (2016),  408–414
  10. Violation of neutrality and occurrence of $S$-shaped current-voltage characteristic for doped semiconductors under double injection

    Fizika i Tekhnika Poluprovodnikov, 47:3 (2013),  302–309
  11. Overheating of an optically triggered SiC thyristor during switch-on and turn-on spread

    Fizika i Tekhnika Poluprovodnikov, 46:9 (2012),  1224–1229
  12. Modulation waves of charge carriers in $n$- and $p$-type semiconductor layers

    Fizika i Tekhnika Poluprovodnikov, 45:2 (2011),  196–201
  13. Оценка роли электронно-дырочного рассеяния в переносе носителей заряда в многослойных арсенид-галлиевых структурах

    Fizika i Tekhnika Poluprovodnikov, 24:9 (1990),  1668–1670
  14. О соотношении подвижностей носителей заряда в полупроводниках $n$- и $p$-типа

    Fizika i Tekhnika Poluprovodnikov, 23:9 (1989),  1658–1663
  15. EFFECT OF THE COMPLETE ENTRAPPING OF NONMAJOR DISCHARGE CARRIERS BY MAJOR CARRIERS AND ITS INFLUENCE ON PROPERTIES OF MULTILAYERED SEMICONDUCTOR STRUCTURES

    Zhurnal Tekhnicheskoi Fiziki, 56:9 (1986),  1827–1829
  16. Effect of Radiation-Induced Defects on Current-Voltage Characteristic of Silicon Multilayer Structures

    Fizika i Tekhnika Poluprovodnikov, 20:3 (1986),  532–534
  17. О соотношении Эйнштейна в полупроводниках в условиях сильного электронно-дырочного рассеяния

    Fizika i Tekhnika Poluprovodnikov, 18:7 (1984),  1293–1296
  18. TRANSITION PROCESS OF THE P-N TRANSITION DIFFUSION SWITCHING

    Zhurnal Tekhnicheskoi Fiziki, 53:1 (1983),  189–191
  19. Исследование влияния оже-рекомбинации на вольтамперную характеристику кремниевых многослойных структур

    Fizika i Tekhnika Poluprovodnikov, 17:3 (1983),  474–478


© Steklov Math. Inst. of RAS, 2026