Publications in Math-Net.Ru
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Effect of erbium fluoride doping on the photoluminescence of SiO$_x$ films
Fizika i Tekhnika Poluprovodnikov, 46:3 (2012), 338–343
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Specific Features and Nature of the 890 nm Photoluminescence Band Detected in SiO$_x$ Films after Low-Temperature Annealing
Fizika i Tekhnika Poluprovodnikov, 45:11 (2011), 1470–1475
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Erratum to: "Electronic States on Silicon Surface after Deposition and Annealing of SiO$_x$ Films"
Fizika i Tekhnika Poluprovodnikov, 45:6 (2011), 856
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Electronic states on silicon surface after deposition and annealing of SiO$_x$ films
Fizika i Tekhnika Poluprovodnikov, 45:5 (2011), 596–601
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Dimension Concentration Instability in Silicon Thin Layers. I
Fizika i Tekhnika Poluprovodnikov, 20:2 (1986), 203–207
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